Scanning Tunneling Microscopy and Atomic Force Microscopy Investigations on Organic Material Thin Films and Adsorbate Particles in Air

  • Michael Hietschold
  • Olaf Pester
  • Waltraud Vollmann
  • Andreas Heilmann
  • Peter Stabeler
  • Hartmut Sbosny
  • Xina Grahlert
  • Hans-Ulrich Sonntag
  • Anna Bruska
  • Bettina Winzer
  • Thomas Schimmel
  • Ludger Koenders

Abstract

We present investigations on polycrystalline thin films of TCNQ and of metal-phthalocyanines as well as of metal-polymer composite material films by scanning tunneling and atomic force microscopy at ambient conditions. The influences of preparation conditions (usual thermal evaporation in high vacuum) as well as external influences such as applied external pressure on the crystallite morphology, surface topography and imaging conditions are discussed. Using a liquid cell in an atomic force microscope, we have been able to resolve the molecular structure of copper- and of leadphthalocyanine crystals. For rough surfaces as discussed above the influence of the mesoscopic tip shape has to be taken into account. We report on theoretical modelling as well as on experimental efforts related to STM imaging using proper tips. In the case of ultrathin organic films, there is often the problem of fixing the molecules to the substrate. We show that in this case after some rather harsh sweeping by the tip, one can observe fairly ordered molecular structures near to the lower part of surface steps on layered material substrates.

Keywords

Atomic Force Microscopy Scan Tunneling Microscopy Force Sensor Scanning Probe Microscopy Scan Tunneling Microscopy Imaging 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    G. Bar, S.N. Magonov, H.-.J. Cantow, J. Gmeiner, and M. Schwoerer, Atomic-scale imaging of anisotropic organic conductors by scanning probe techniques (STM/AFM), Ultramicrosc. 42: 644 (1992).CrossRefGoogle Scholar
  2. 2.
    W. Vollmann and G. Adam, Druckabhangigkeit der elektrischen Leitfahigkeit organischer TCNQKomplexschichten als Basis fur Druck-und Kraftsensoren, Wiss. Zeitschr.TU Karl-Marx-Stadt 32: 85 (1990).Google Scholar
  3. 3.
    M. Hietschold, W. Vollmann, A. Mrwa, A. Heilmann, and P.K. Hansma, STM and AFM investigations on organic solids, phys. stat. sol. (a) 131: 59 (1991).Google Scholar
  4. 4.
    A. Mrwa, H. Giegengack, H.-J. Hohne, M. Starke and C. Hamann, Zur Struktur von Bleiphthalocyanin-Dunnschichten, Wiss. Zeitschr. TU Karl-Marx-Stadt 31: 229 (1989).Google Scholar
  5. 5.
    A. Heilmann and C. Hamann, Deposition, structure, and properties of plasma polymer metal composite films, Progr. Colloid Polym. Sci. 85: 102 (1991).CrossRefGoogle Scholar
  6. 6.
    O. Pester, M. Hietschold, and D. Porezag, Molecular resolution images of copper-and leadphthalocyanine single crystals by atomic force microscopy, submitted to Uliramicroscopy. Google Scholar
  7. 7.
    M. Hietschold, G. Wolff, and D. Porezag, to he published.Google Scholar
  8. 8.
    M. Hietschold, and H. Sbosny, Simple model for the topographic imaging process in a scanning tunneling microscope. Ultramicrosc. 42–44: 200 (1992).Google Scholar
  9. 9.
    H. Sbosny, M. Hietschold, and L. Koenders, to be published.Google Scholar
  10. 10.
    J. Tersoff and D.R. Hamann, Theory of the scanning tunneling microscope, Phys. Rev. B 31: 805 (1985).Google Scholar
  11. 11.
    B. Winzer, Th. Schimmel, M. Hietschold, J. Kuppers, and A. Mrwa, to be published.Google Scholar

Copyright information

© Springer Science+Business Media New York 1994

Authors and Affiliations

  • Michael Hietschold
    • 1
  • Olaf Pester
    • 1
  • Waltraud Vollmann
    • 1
  • Andreas Heilmann
    • 1
  • Peter Stabeler
    • 1
  • Hartmut Sbosny
    • 1
  • Xina Grahlert
    • 1
  • Hans-Ulrich Sonntag
    • 1
  • Anna Bruska
    • 2
  • Bettina Winzer
    • 3
  • Thomas Schimmel
    • 4
  • Ludger Koenders
    • 5
  1. 1.Department of PhysicsTechnical University of Chemnitz-ZwickauGermany
  2. 2.Institute of PhysicsN. Copernicus UniversityTorunPoland
  3. 3.Max Planck GesellschaftHeterogeneous Solids GroupDresdenGermany
  4. 4.Institute of Experimental Physics VIUniversity of BayreuthGermany
  5. 5.Physikalisch-Technische Bundesanstalt BraunschweigGermany

Personalised recommendations