Abstract
The Silicon Microvertex Detector (SMD) was designed to upgrade the central tracking capability of the Luminosity 3 (L3) experiment at the CERN LEP storage ring (Large Electron Positron)1. The SMD allows a two-dimensional measurement of charged particle tracks over the polar angle region 22°<θ<158° and over the full azimuthal region, improving the L3 impact parameter resolution, momentum and Z coordinate measurements. High performance vertex reconstruction depends, among other parameters, on the accurate knowledge of the detector position in space and on its stability in time. A full description of SMD design parameters can be found in2. Each technological operation involved in SMD manufacturing process2,3 requires careful monitor of multiple geometrical parameters, at micron level, for each constitutive part as well as for the whole detector4’5.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
M. Acciarri et al, The L3 silicon microvertex detector: installation and results on 1993 performance, Nucl. Instr. and Meth., A360, 103–109 (1995).
M. Acciarri et al., The L3 silicon microvertex detector: the L3 SMD collaboration, CERN-PPE/94–122 (1994).
T. Angelescu et al., Assembling process of a silicon microstrip sensor for nuclear particle detector, Proc. of NEXUS EAST Workshop, Sinaia, Romania (1995).
O. Adriani et al., Status of the L3 silicon microvertex detector, Nucl. Phys. (Proc. Suppl), B32, 202–207 (1993),.
B. Aplat et al., The design of the L3 silicon microvertex detector, Nucl. Instr. and Meth., A315, 192–200(1992).
BHN506 Coordinate Measuring Machine, Mitutoyo Corporation 31–19, Shiba 5-chome, Minato-ku, Tokyo 108, Japan.
Araldite A W106 (HV953U), Ciba-Geigy SA, CH-4002 Bassel, Switzerland. Stycast 2850FT (24LV), W.R.Grace Co., 77 Dragon Ct., Woburn, MA, USA.
Model 2000XL, EFD Inc., 977 Waterman Avenue, East Providence, RI02914, USA.
Model 4123, Kulicke & SofFa Industries Inc., 507 Prudential Road, Horsham, PA, 19044, USA
G. Ambrosi et al., Control parameters analysis for the L3 SMD manufacturing process, UBPub.EPPG/Phys.23 and INFN&Univ.Perugia, (1995).
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1997 Springer Science+Business Media New York
About this chapter
Cite this chapter
Ambrosi, G. et al. (1997). Dimensional Measurements Analysis of a Silicon Half Ladeer Microvertex Detector. In: Lampropoulos, G.A., Lessard, R.A. (eds) Applications of Photonic Technology 2. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-9250-8_127
Download citation
DOI: https://doi.org/10.1007/978-1-4757-9250-8_127
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4757-9252-2
Online ISBN: 978-1-4757-9250-8
eBook Packages: Springer Book Archive