Abstract
The X-ray diffraction, Scanning Tunneling Microscope and Scanning Force Microscope were ultilized to characterize the surface morphology and the crystal structure of YBa2Cu3OY(YBCO) and LaSrGaOy (LSGO) thin films on MgO(OOl) and SrTiO3(001) substrates. YBCO and LSGO films were prepared by the rf magnetron sputtering and the pulse laser ablation. The X-ray diffraction pattern shows that YBCO and LSGO films on SrTiO3(001) and MgO(001) were epitaxial, with the crystal c-axis perpendicular to the plane of the substrate. Spiral dislocation and layer-cake-like morphology were observed in YBCO films. Tc of the as grown YBCO films was about 90 K with the critical current density greater than 106 A/cm2 at 77 K.
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Yang, H.C. et al. (1996). Synthesis and Characterization of YBa2Cu3OY and LaSrGaOy Thin Films. In: Summers, L.T. (eds) Advances in Cryogenic Engineering Materials . Advances in Cryogenic Engineering Materials , vol 42. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-9059-7_95
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DOI: https://doi.org/10.1007/978-1-4757-9059-7_95
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