Investigation of Microscopic Strain by X-Ray Diffraction in Nb3Sn Tape Conductors Subjected to Compressive and Tensile Strains

  • Bennie ten Haken
  • Arno Godeke
  • Herman H. J. ten Kate
Part of the Advances in Cryogenic Engineering Materials book series (ACRE, volume 42)


A new experimental set-up is developed in which the lattice deformation of a thin layer can be investigated by X-ray diffraction. The investigated layer is cooled to low temperatures below 20 K and can be deformed by means of a bending spring. This set-up is used to study the lattice deformation in a polycrystalline Nb3Sn layer as a function of the macroscopically applied strain. This comparison is made at a low temperature near the critical temperature and below the cubic to tetragonal transition temperature of Nb3Sn. A very good correlation is found between the lattice deformation and the applied strain in a Nb3Sn layer. These experimental results show that the compressive and tensile strain applied by bending the substrate are well transmitted to the Nb3Sn grains inside the polycrystalline layer of a tape sample. Also it enables a direct comparison between the critical properties of a deformed Nb3Sn layer and the lattice parameters.


Critical Property Applied Strain Lattice Deformation Macroscopic Strain Strain Dependence 
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Copyright information

© Springer Science+Business Media New York 1996

Authors and Affiliations

  • Bennie ten Haken
    • 1
  • Arno Godeke
    • 1
  • Herman H. J. ten Kate
    • 1
  1. 1.Low Temperature DivisionUniversity of TwenteAE Enschedethe Netherlands

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