Effect of Inhomogeneous Distribution of Pinning Strength on Current-Voltage Characteristics in High-Temperature Superconductors
The scaling of the current-voltage curves of thin film high temperature superconductors under the perpendicular magnetic field is theoretically examined using the flux creep model in which the effects of the distributed flux pinning strength and the flux flow at weakly pinned regions are taken into account. It is found that the scaling is obtained also for the theoretical result from the flux creep model. At the same time the obtained dynamic and static critical indices are close to experimental results on Y-123 and Bi-2223 thin films. Agreement is satisfactory also for the “transition” line in Bi-2223 films. It is concluded that the mechanism of the flux creep-flow explains the dynamic behavior of thermally activated fluxoids.
KeywordsHigh Temperature Superconductor Critical Current Density Critical Index Flux Flow Flow Resistivity
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