The Influence of Pre-Existing Defects on the Bending Strain Behavior of Bi2Sr2Ca1Cu2Ox and (Bi,Pb)2Sr2Ca2Cu3Ox Ag-Sheathed Tapes

  • A. A. Polyanskii
  • M. Polak
  • J. W. Anderson
  • W. Zhang
  • E. E. Hellstrom
  • D. C. Larbalestier
Part of the Advances in Cryogenic Engineering book series (ACRE, volume 44)

Abstract

The effect of pre-existing defects on the bend strain behavior in Bi2Sr2Ca,Cu2OX (Bi-2212) and (Bi,Pb)2Sr2Ca2Cu3OX (Bi-2223) Ag-sheathed tapes was studied. For Bi-2212 at 4.2 K, we found that the transport critical current (Ic) declined by only 1% at bending strains less than 0.15%. However, the magnetization critical current density was sensitive to small bending strains, as evidenced by a strain of ~ 0.08%, which reduced the magnetization by 25%. For pressed Bi-2223 tapes at 77 K, essentially no reduction in was observed for strains less than 0.1%. At strains greater than 0.2%, lc dropped to only 10% of its original value at a strain of ~0.4%. The magnetization of pressed Bi-2223 at 77 K responded similarly to that of Bi-2212 tapes. Using magneto-optical imaging, we observed that the strain tolerance of Bi-2212 and Bi-2223 is strongly dependent on the pre-existing defects found in the cores of the tapes.

Keywords

Test Section Critical Current Indicator Film Advance Research Project Agency Silver Sheath 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    J. W. Ekin, D. K. Finnemore, Qiang Li, J. Tenbrink, W. Carter, Appl. Phys. Lett. 61: 858 (1992).Google Scholar
  2. 2.
    K. Katagiri, H.S. Shin, Y. Shoji, N. Ebisawa. K. Watanabe, K. Noto, T.Okada, M. Hiraoka, S. Yuya, Cryogenics 36: 491 (1996).CrossRefGoogle Scholar
  3. 3.
    R. Wesche, A. M. Fuchs, B. Jakob, G. Pasztor, Cryogenics 36: 419 (1996).CrossRefGoogle Scholar
  4. 4.
    S. Patel, S. Chen, T. Haugan, F. Wong, D. T. Shaw, Cryogenics 35: 257 (1996).CrossRefGoogle Scholar
  5. 5.
    S. X. Dou, H. K. Liu, Supercond. Sci. Technol 6: 297 (1993).ADSCrossRefGoogle Scholar
  6. 6.
    M. Polak, J. A. Panel!, A. A. Polyanskii, A. E. Pashitski, and D. C. Larbalestier, Appl. Phys. Lett. 70: 1034 (1997).ADSCrossRefGoogle Scholar
  7. 7.
    J. W. Anderson, J. A. Panel!, P.V.P.S.S. Sastry, and D. C. Larbalestier, IEEE Trans. Appl. Supercond. 7: 1422 (1997).ADSCrossRefGoogle Scholar
  8. 8.
    M. Polak, W. Zhang, A. Polyanskii, A. Pashitski, E. E. Hellstrom, and D. C. Larbalestier IEEE Trans. Appl. Supercond. 7: 1537 (1997)CrossRefGoogle Scholar
  9. 9.
    J. A. Panel!, A. A. Polyanskii, A. E. Pashitski, and D. C. Larbalestier, Supercond. Sci. Technol. 9: 393 (1996)ADSCrossRefGoogle Scholar
  10. 10.
    A. Polyanskii, A. Pashitski, A. Gurevich, J. A. Parrell, M. Polak, D. C. Larbalestier, S. R. Foltyn, and P. N. Arendt, ISS’96, Sapporo, Japan (1996).Google Scholar
  11. 11.
    B. A. Glowacki and J. Jackiewizc, J. Appl. Phys. 75: 2992 (1994).ADSCrossRefGoogle Scholar
  12. 12.
    D. A. Korzekwa, J. F. Bingert, E. J. Podtburg, and P. Miles, Appl. Supercond. 2: 26 (1994).CrossRefGoogle Scholar

Copyright information

© Springer Science+Business Media New York 1998

Authors and Affiliations

  • A. A. Polyanskii
    • 1
    • 2
  • M. Polak
    • 1
    • 3
  • J. W. Anderson
    • 1
  • W. Zhang
    • 1
    • 4
  • E. E. Hellstrom
    • 1
  • D. C. Larbalestier
    • 1
  1. 1.Applied Superconductivity CenterUniversity of Wisconsin-MadisonMadisonUSA
  2. 2.Also Institute of Solid State Physics ChernogolovkaMoscowRussia
  3. 3.On leave from the Institute of Electrical EngineeringBratislavaSlovakia
  4. 4.Now at American Superconductor CorporationWestboroughUSA

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