Influence of Thickness on Orientational Dependence of Critical Current Density of NbTi Thin Films

  • M. Takeda
  • K. Nishigaki
  • H. Toda
Part of the Advances in Cryogenic Engineering book series (ACRE, volume 44)


The influence of thickness on the orientational dependence of critical current density J c of NbTi thin films has been studied experimentally. The thickness, d, of the films investigated are 26 mn, 35 nm, 50 nm, and 120 nm. Measurements of J c as a function of the amplitude and orientation of the magnetic field B with respect to the film plane are performed at 4.2 K. It is found that the orientational dependence of J c clearly changes from a simple behavior to a more complex one with increasing the thickness of the films. The ratio of J c for perpendicular and parallel film orientation is empirically seen to increase as d 1/2 . The parallel field dependence of J c is qualitatively described using the theoretical expressions derived by Mawatari and Yamafuji.


Critical Current Density High Magnetic Field Multilayer Film Film Plane Theoretical Expression 
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  1. 1.
    S. Ogawa, M. Yoshitake, K. Nishigaki, T. Sugioka, M. Inoue, and Y. Saji, “Possibilities of high magnetic field shielding with large scale superconducting NbTi-Cu multilayer film”, Adv. Cryo. Eng. Vol. 37A, 505 (1992).Google Scholar
  2. 2.
    K. Nishigaki, A. Fujishiro, M. Takeda, S. Ogawa, M. Sato, and M. Inoue, “Measurements of magnetic field shielding effects of NbTi-Cu multilayer films by a SQUID-based magnetometer”, Adv. Super. V, 1285 (1993).Google Scholar
  3. 3.
    K. Nishigaki, S. Ogawa, M. Yoshitake, Y. Maruno, M. Takeda, and H. Toda, “Thickness dependence of superconducting NbTi film on T, and J,, Adv. Super. VII, 983 (1995).Google Scholar
  4. 4.
    M. Takeda, K. Nishigaki, and H. Toda, “Orientational dependence of critical current density of NbTi thin film in a magnetic field”, ICEC16/ICMC(1996) PS2-m1–14; Cryogenics (1997).Google Scholar
  5. 5.
    G. Stejic, A. Gurevich, E. Kadyrov, D. Christen, R. Joynt, and D.C. Larbalestier, “Effect of geometry on the critical currents of thin films”, Phys. Rev. B Vol. 49, 1274 (1994).ADSCrossRefGoogle Scholar
  6. 6.
    K. Nishigaki and M. Takeda, “Simple multipurpose cryostat for experiments using high magnetic field”, Jpn. J. Appl. Phys. Vol.35, Partl, No. 1A, 304 (1996).ADSCrossRefGoogle Scholar
  7. 7.
    Y. Mawatari and K. Yamafuji, “Critical current density in thin films due to the surface barrier”,Physica C Vol. 228, 336 (1994).Google Scholar

Copyright information

© Springer Science+Business Media New York 1998

Authors and Affiliations

  • M. Takeda
    • 1
  • K. Nishigaki
    • 1
  • H. Toda
    • 2
  1. 1.Kobe University of Mercantile MarineHigashinada-ku, Kobe 658Japan
  2. 2.Koatsu Gas Kogyo Co., Ltd.Kita-ku, Osaka 530Japan

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