Abstract
High Jc YBCO thin film tapes were continuously fabricated on flexible Ni-based alloy. Biaxially aligned YBCO films were deposited by PLD on textured YSZ buffer layers formed by using IBAD (ion-beam-assisted deposition). For the short sample, Jc value of 1.13×106A/cm22 (77K, OT) was obtained and 1.1×105A/cm2 was maintained at 5T (Bic) with measured length of 1cm. For the long sample, Jc value of 2.1×105A/cm2, and Ic value of 20.8A were obtained (77K, OT) with measured length of 0.7m. Longitudinal uniformity of the long sample was excellent. Self-field a.c. losses of 0.25m length tapes were measured by a.c. four probe method. The results agreed with Norris’ prediction of low a.c. losses for thin strip conductors.
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Hosaka, M., Iijima, Y., Sadakata, N., Saitoh, T., Kohno, O., Takeda, K. (1998). Biaxially Aligned High Jc YBCO Tapes on YSZ Buffer Layers Deposited By IBAD Method. In: Balachandran, U.B., Gubser, D.G., Hartwig, K.T., Reed, R.P., Warnes, W.H., Bardos, V.A. (eds) Advances in Cryogenic Engineering Materials . Advances in Cryogenic Engineering, vol 44. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-9056-6_106
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DOI: https://doi.org/10.1007/978-1-4757-9056-6_106
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