Abstract
Using Nb/Al technology, we are developing Josephson junctions for high-resolution X-ray spectroscopy. Quasiparticle loss due to trapping in the anodized edges of the present junctions degrades the X-ray energy resolution. We present the design and fabrication process of a new junction geometry that aims to minimize this kind of quasiparticle loss. The I-V characteristics of the new junctions indicate good junction quality.
Keywords
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
This is a preview of subscription content, log in via an institution.
Buying options
Tax calculation will be finalised at checkout
Purchases are for personal use only
Learn about institutional subscriptionsPreview
Unable to display preview. Download preview PDF.
References
A. Barone, R. Cristiano, and S. Pagano, eds., “Proceedings of the Workshop X-Ray Detection by Superconducting Tunnel Junctions,” World Scientific, Singapore (1991).
N.E. Booth, Quasiparticle trapping and the quasiparticle multiplier, Appl. Phys. Leu. 50: 293 (1987).
H. Kroger, L.N. Smith, and D.W. Jillie, Selective niobium anodization process for fabricating Josephson tunnel junctions, Appl. Phys. Lett. 39: 280 (1981).
J.B. le Grand, M.L. van den Berg, M.P. Bruijn, M. Frericks, P.A.J. de Korte, J.G. Gijsbertsen, E.P. Houwman, and J. Flokstra, Superconductive tunnel junctions for X-ray spectroscopy, IEEE Trans. Appl. Supercotal. 3: 2070 (1993).
J. Halbritter, On the oxidation and on the superconductivity of niobium, Appl. Phys. Lett. 43: 1 (1987).
A. Matsumara, T. Takahashi, and M. Kurakado, X-ray detection with Nb/AIOx/Nb superconducting tunnel junctions and energy diffusion effect on energy resolution, Nucl. Instr. Methods Phys. Res. A329: 227 (1993).
K. Kuroda and M. Yuda, Niobium-stress influence on Nb/Al-oxide/Nb Josephson junctions, J. Appl. Phys. 63: 2352 (1988).
E.P. Houwman, J.G. Gijsbertsen, J. Flokstra, and H. Rogalla, Proximity effect in Nb/AI,AI oxide, Al/Nb Josephson tunnel junctions, IEEE Trans. Appl. Supercond. 3: 2170 (1993).
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1994 Springer Science+Business Media New York
About this chapter
Cite this chapter
Gijsbertsen, J.G., Houwman, E.P., Flokstra, J., Rogalla, H. (1994). Design of Josephson Junctions for X-Ray Detection with Small Quasiparticle Loss at the Edges. In: Reed, R.P., Fickett, F.R., Summers, L.T., Stieg, M. (eds) Advances in Cryogenic Engineering Materials . An International Cryogenic Materials Conference Publication, vol 40. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-9053-5_45
Download citation
DOI: https://doi.org/10.1007/978-1-4757-9053-5_45
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4757-9055-9
Online ISBN: 978-1-4757-9053-5
eBook Packages: Springer Book Archive