Tests for p-port SRAMs

  • Said Hamdioui
Part of the Frontiers in Electronic Testing book series (FRET, volume 26)

Abstract

Chapter 8 introduced realistic fault models for p-port (pP) memories. They have been divided into p classes: single-port faults (1PFs), two-port faults (2PFs), ..., p-port faults (pPFs). Tests for 1PFs and 2PFs have been addressed in Chapter 6; while tests for pPFs (p > 2) have to be established.

Keywords

Test Strategy Simultaneous Operation Test Length Fault Coverage Read Operation 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media New York 2004

Authors and Affiliations

  • Said Hamdioui
    • 1
  1. 1.Delft University of TechnologyThe Netherlands

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