Tests for p-port SRAMs
Chapter 8 introduced realistic fault models for p-port (pP) memories. They have been divided into p classes: single-port faults (1PFs), two-port faults (2PFs), ..., p-port faults (pPFs). Tests for 1PFs and 2PFs have been addressed in Chapter 6; while tests for pPFs (p > 2) have to be established.
KeywordsTest Strategy Simultaneous Operation Test Length Fault Coverage Read Operation
Unable to display preview. Download preview PDF.