Space of memory faults

  • Said Hamdioui
Part of the Frontiers in Electronic Testing book series (FRET, volume 26)

Abstract

In Chapter 2, different SRAM models have been discussed; e.g., the functional model, which is the collection of the functional specifications of the memory together with the internal structure of its subsystems. In general, the functional model of a memory depends on its specific implementation. However, for test purposes a so called ‘reduced functional memory model’ is used that only consists of three subsystems: the address decoder, the memory cell array and the read/write logic. Since the vast majority of mainstream memory devices contains these three subsystems, the reduced functional fault model is, to a large extent, independent of specific memory implementations.

Keywords

Simultaneous Operation Read Operation Fault Effect Memory Fault Faulty Behavior 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media New York 2004

Authors and Affiliations

  • Said Hamdioui
    • 1
  1. 1.Delft University of TechnologyThe Netherlands

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