Abstract
In Chapter 2, different SRAM models have been discussed; e.g., the functional model, which is the collection of the functional specifications of the memory together with the internal structure of its subsystems. In general, the functional model of a memory depends on its specific implementation. However, for test purposes a so called ‘reduced functional memory model’ is used that only consists of three subsystems: the address decoder, the memory cell array and the read/write logic. Since the vast majority of mainstream memory devices contains these three subsystems, the reduced functional fault model is, to a large extent, independent of specific memory implementations.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
Author information
Authors and Affiliations
Rights and permissions
Copyright information
© 2004 Springer Science+Business Media New York
About this chapter
Cite this chapter
Hamdioui, S. (2004). Space of memory faults. In: Testing Static Random Access Memories. Frontiers in Electronic Testing, vol 26. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-6706-3_3
Download citation
DOI: https://doi.org/10.1007/978-1-4757-6706-3_3
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4419-5430-5
Online ISBN: 978-1-4757-6706-3
eBook Packages: Springer Book Archive