Semiconductor memory architecture

  • Said Hamdioui
Part of the Frontiers in Electronic Testing book series (FRET, volume 26)

Abstract

As it is mentioned in Chapter 1, the main purpose of this book is to develop realistic fault models and efficient test algorithms for multi-port SRAMs. It is therefore of interest to understand in detail the structure of such memories as well as the way they operate.

Keywords

Memory Cell Read Operation PMOS Transistor Static Random Access Memory Memory Behavior 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media New York 2004

Authors and Affiliations

  • Said Hamdioui
    • 1
  1. 1.Delft University of TechnologyThe Netherlands

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