Abstract
There is a controversial aspect to using electron scattering data for ab initio determination of crystal structures. The observed intensities are often imagined to be so effectively contaminated by various perturbations to obscure the desired, single-scattering, kinematical information. It would be a mistake to pretend that such perturbations do not exist. The approach taken in this book, i.e., the search for experimental conditions to favor collection of quasi-kinematical data, must be based on a realistic understanding of such theoretical constraints. The following is a review of the major causes for deviation of the observed electron microscope images or electron diffraction intensities from a straightforward representation of the unit cell contents.
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© 1995 Springer Science+Business Media New York
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Dorset, D.L. (1995). Data Perturbations. In: Structural Electron Crystallography. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-6621-9_5
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DOI: https://doi.org/10.1007/978-1-4757-6621-9_5
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4757-6623-3
Online ISBN: 978-1-4757-6621-9
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