Ultrafast Transport Measurements in Bulk Semiconductors and Tunneling Devices Using Electro-Optic Sampling

  • Kevin E. Meyer
Part of the NATO ASI Series book series (NSSB, volume 206)


Electro-optic sampling (EOS) is a technique which has been developed for measuring transient electrical fields with subpicosecond resolution. It takes advantage of the inherent speed of the linear electro-optic effect (Pockels effect) to convert a fast electrical transient into a fast optical transient. The optical transient is then probed using the conventional pump/probe approach in conjunction with a short-pulse dye laser. Two applications of this technique will be discussed which are relevant to the study of transport physics on small time and dimension scales.


Transmission Line Probe Beam Resonant Tunneling Diode Tunneling Time Velocity Overshoot 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.


  1. 1.
    J. A. Valdmanis, G. Mourou, and C. W. Gabel, Appl. Phys. Lett. 41, 211 (1982).ADSCrossRefGoogle Scholar
  2. 2.
    J. F. Whitaker, T. B. Norris, G. A. Mourou, and T. Y. Hsiang, IEEE Trans. Microwave Theory and Tech. MTT-35, 42 (1983).Google Scholar
  3. 3.
    Charles J. Cryjak, Kevin E. Meyer, and Gerard A. Mourou, Proceedings of the Topical Meeting on Picosecond Electronics and Optoelectronics, Lake Tahoe, Nevada, March 13–15, 1985 (Springer-Verlag, New York) pp. 244–8.Google Scholar
  4. 4.
    K. E. Meyer, D. R. Dykaar, and G. A. Mourou, ibid, pp.54–7.Google Scholar
  5. 5.
    Douglass R. Dykaar, Ph.D thesis, Dept. of Electrical Engineering, University of Rochester, New York, May, 1987.Google Scholar
  6. 6.
    U. Keller, S. K. Diamond, B. A, Auld, and D. M. B.oom, Appl. Phys. Lett. 53, 388 (1988).ADSCrossRefGoogle Scholar
  7. 7.
    K. J. Weingarten, M. J. Rodwell, H. K. Heinrich, B. H. Kollner, and B. M. Bloom. Electron. Lett. 21, 765 (1985).ADSCrossRefGoogle Scholar
  8. 8.
    X. C. Zhang and R. K. Jain, Electron. Lett. 22, 264 (1986).CrossRefGoogle Scholar
  9. 9.
    Kevin Meyer, Maurice Pessot, Gerard Mourou, Robert Grondin, and Sleiman Chamoun, Appl. Phys. Lett. 53, 2254 (1988).ADSCrossRefGoogle Scholar
  10. 10.
    S. N. Chamoun, R. Joshi, E. N. Arnold, R. O. Grondin, K. E. Meyer, M. Pessot, and G. A. Mourou, to be published in the Journal of Applied Physics, July 1989.Google Scholar
  11. 11.
    J. Nees and G. Mourou, Electron. Lett. 22, 918 (1986).CrossRefGoogle Scholar
  12. 12.
    J. M. Weisenfeld, R. S. Tucker, A. Antreasyan, C. A. Burrus, A. J. Taylor, V. D. Mattera jr., and P. A. Garbinsk, Appl. Phys. Lett. 50, 1310 (1987).Google Scholar
  13. 13.
    G. A. Mourou and K. E. Meyer, Appl. Phys. Lett. 45, 492 (1984).ADSCrossRefGoogle Scholar
  14. 14.
    K. E. Meyer and G. A. Mourou, Electron. Lett. 21, 568 (1985).ADSCrossRefGoogle Scholar
  15. 15.
    J. A. Valdmanis, Electron. Lett. 23, 1308 (1987).CrossRefGoogle Scholar
  16. 16.
    B. H. Kollner and D. M. Bloom, IEEE J. Quantum Electron. JQE-22, 79 (1986).Google Scholar
  17. 17.
    D. Grischkowsky and A. C. Balant, Appl. Phys. Lett. 41, 1 (1982).ADSCrossRefGoogle Scholar
  18. 18.
    Hartmut Roskos, S. Optiz, Alois Seilmeir, and W. Kaiser, IEEE J. Quantum Electron.JQE-22, 697 (1986).Google Scholar
  19. 19.
    Martin P. Dawson, Thomas F. Bogges, and Arthur L. Smirl, Optics Lett. 12, 590 ( (1987).Google Scholar
  20. 20.
    P. Beaud, B. Zysset, A. P. Schwarzenbach, and H. P. Weber, Optics Lett. 11, 24 (1986).ADSCrossRefGoogle Scholar
  21. 21.
    N. Langford, K. Smith, and W. Sibbet, Opt. Commun. 64, 274 (1988).ADSCrossRefGoogle Scholar
  22. 22.
    B. H. Kollner, D. M. Bloom, and P. S. Cross, Electron. Lett. 19, 574 (1983).CrossRefGoogle Scholar
  23. 23.
    R. O. Grondin, P. Lugli, D. K. Ferry, and H. L. Grubin, in Picosecond Optoelectronics, Proc. SPIE 439, 18 (1983).CrossRefGoogle Scholar
  24. 24.
    D. K. Ferry, H. L. Grubin, and G. J. Iafrate, in Semiconductors Probed by Ultrafast Laser Spectroscopy, ed. by R. R. Alfano ( Academic Press, NY, 1984 ).Google Scholar
  25. 25.
    K. Hess and G. J. Iafrate, Proc. IEEE 76, 519 (1988).CrossRefGoogle Scholar
  26. 26.
    R. B. Hammond, Physica B134, 475 (1985).Google Scholar
  27. 27.
    G. Mourou, K. Meyer, J. Whitaker, M. Pessot, R. Grondin, and C. Caruso, in Picosecond Electronics and Optoelectronics II, Springer Series in Electronics and Photonics 24, 40 (1987).CrossRefGoogle Scholar
  28. 28.
    M. C. Nuss, D. H. Auston, and F. Capasso, Phys. Rev. Lett. 58, 2355 (1987).ADSCrossRefGoogle Scholar
  29. 29.
    R. Joshi, S. Chamoun, and R. O. Grondin, Proceedings of the Picosecond Electronics and Optoelectronics Topical Meeting, Salt Lake City, Utah, March 8–10,1989 (Optical Society of America, 1989 ).Google Scholar
  30. 30.
    P. Lugli and D. K. Ferry, IEEE Trans. Electron. Dev. ED-32, 431 (1985).Google Scholar
  31. 31.
    M. A. Osman and D. K. Ferry, J. Appl. Phys. 61, 5330 (1987).ADSCrossRefGoogle Scholar
  32. 32.
    M. D’yakonov, I. Perel, and I. N. Yassievich, Soy. Phys. Semicond. 11, 801 (1987).Google Scholar
  33. 33.
    P. Lugli, C. Jacobani, L. Reggiani, and P. Kocevar, Appl. Phys. Lett. 50, 1521 (1987).CrossRefGoogle Scholar
  34. 34.
    D. Jones and H. D. Rees, J. Phys. C6, 1781 (1973).ADSGoogle Scholar
  35. 35.
    R. O. Grondin and M. J. Kann, Solid State Electron. 31, 567 (1988).ADSCrossRefGoogle Scholar
  36. 36.
    J. A. Kash, S. S. Jha, and J. C. Tsang, Phys. Rev. Lett. 58, 1869 (1987).ADSCrossRefGoogle Scholar
  37. 37.
    G. M. Wysin, D. L. Smith, and A. Redondo (unpublished).Google Scholar
  38. 38.
    R. Brennan and K. Hess, Phys. Rev. B29, 5581 (1984).ADSCrossRefGoogle Scholar
  39. 39.
    A. J. Taylor, D. J. Erskine, and C. L. Tang, J. Opt. Soc. Am. B2, 663 (1985).ADSCrossRefGoogle Scholar
  40. 40.
    J. Shah, B. Deveaud, T. C. Damen, W. T. Tsang, A, C. Gossard, and P. Lugli, Phys. Rev. Lett. 59, 22–22 (1987).CrossRefGoogle Scholar
  41. 41.
    D. H. Auston, IEEE J. Quantum Electron. 19, 639 (1983).ADSCrossRefGoogle Scholar
  42. 42.
    J. F. Whitaker, R. Sobolewski, D. Dykaar, T. Hsiang, and G. Mourou, IEEE Trans. Microwave Theory and Techniques MTT-36 (1988).Google Scholar
  43. 42.
    Kevin E. Meyer, Ph.D thesis, Department of Physics and Astronomy, University of Rochester, New York, May 1988.Google Scholar
  44. 43.
    H. L. Grubin, private communication.Google Scholar
  45. 44.
    R. Tsu and L. Esaki, Appl. Phys. Lett. 22, 562 (1973).ADSCrossRefGoogle Scholar
  46. 45.
    T. C. L. G. Sollner, W. D. Goodhue, P. E. Tannerwald, C. D. Parker, and D. D. Peck, Appl. Phys. Lett. 43, 588 (1983).ADSCrossRefGoogle Scholar
  47. 46.
    E. R. Brown, W. D. Goodhue, and T. C. L. G. Sollner, J. Appl. Phys. 64, 1519 (1988).ADSCrossRefGoogle Scholar
  48. 47.
    N. C. Kluksdahl, A. M. Kriman, and David K. Ferry, WEE Electron Dev. Lett. 9, 457 (1988).Google Scholar
  49. 48.
    D. Y. Oberli, J. Shah, T. C. Damen, C. W. Tu, and D. A. B. Miller, Proceedings of the Quantum Wells for Optics and Optoelectronics Topical Meeting, March 6–8, 1989, Salt Lake City, Utah (Optical Society of America, Washington, DC).Google Scholar
  50. 49.
    J. F. Whitaker, G. A. Mourou, T. C. L. G. Sollner, and W. D. Goodhue, Appl. Phys. Lett. 53, 385 (1988).ADSCrossRefGoogle Scholar
  51. 50.
    W. D. Goodhue, T. C. L. G. Sollner, H. Q. Le, E. R. Brown, and B. A. Vojak, Appl. Phys. Lett. 49, 1086 (1986).ADSCrossRefGoogle Scholar
  52. 51.
    D. D. Coon and H. C. Liu, Appl. Phys. Lett. 49, 94 (1986).ADSCrossRefGoogle Scholar
  53. 52.
    H. C. Liu and D. D. Coon, Appl. Phys. Lett. 50, 1246 (1987).ADSCrossRefGoogle Scholar
  54. 53.
    John Whitaker, private communication.Google Scholar
  55. 54.
    S. K. Diamond, E. Ozbay, M. J. W. Rodwell, D. M. Bloom, Y. C. Pao, and J. S. Harris, Appl. Phys. Lett. 54, 153 (1989).ADSCrossRefGoogle Scholar
  56. 55.
    S. K. Diamond, E. Ozbay, M. J. W. Rodwell, D. M. Bloom, Y. C. Pao, E. Wolak, and J. S. Harris, Proceedings of the 1989 Picosecond Electronics and Optoe1ectronics Conference, March 8–10, 1989, Salt Lake City, Utah ( Optical Society of America, Washington, DC, 1989 ).Google Scholar
  57. 56.
    Kurt J. Weingarten, Mark J. W. Rodwell, and David Bloom, IEEE J. Quant. Electron. QE-24, 198 (1988).Google Scholar
  58. 57.
    S. K. Diamond, E. Ozbay, M. J. W. Rodwell, David M. Bloom, Y. C. Pao, E. Wolak, and James H. Harris, IEEE Electron Dev. Lett. 10, 104 (1989).ADSCrossRefGoogle Scholar

Copyright information

© Springer Science+Business Media New York 1989

Authors and Affiliations

  • Kevin E. Meyer
    • 1
  1. 1.Cavendish LaboratoryUniversity of CambridgeCambridgeEngland

Personalised recommendations