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© 2001 Springer Science+Business Media New York
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Offutt, J. (2001). Panel Future of Mutation Testing and Its Application. In: Wong, W.E. (eds) Mutation Testing for the New Century. The Springer International Series on Advances in Database Systems, vol 24. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-5939-6_15
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DOI: https://doi.org/10.1007/978-1-4757-5939-6_15
Publisher Name: Springer, Boston, MA
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