Skip to main content

Models for Degradation Processes and Event Times Based on Gaussian Processes

  • Chapter
Lifetime Data: Models in Reliability and Survival Analysis

Abstract

We present two stochastic models that describe the relationship between marker process values at random time points, event times, and a vector of covariates. In both models the marker processes are degradation processes that represent the decay of systems over time. In the first model the degradation process is a Wiener process whose drift is a function of the covariate vector; in the second model the degradation process is taken to be the difference between a stationary Gaussian process and a time drift whose drift parameter is a function of the covariates. For both models we present statistical methods for estimation of the regression coefficients. The first model is useful for predicting the residual time from study entry to the time a critical boundary is reached while the second model is useful for predicting the latency time from the event initiating degradation until the time the presence of degradation is detected. We present our methods principally in the context of conducting inference in a population of HIV infected individuals.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 129.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 169.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD 169.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  • Berman SM. (1990). A stochastic model for the distribution of HIV latency time based on T4 counts. Biometrika 77, 733–741.

    Article  MATH  Google Scholar 

  • CDC (1993). Revision of the HIV classification system and the AIDS surveillance definition. Center for Disease Control and Prevention (Atlanta).

    Google Scholar 

  • Chhikara RS, Folks L. (1989). The Inverse Gaussian Distribution. Theory, Methodology and Applications. Marcel Dekker, New York.

    Google Scholar 

  • Doksum KA, Hóyland A. (1992). Models for variable-stress accelerated life testing experiments based on Wiener processes and the inverse Gaussian distribution. Technometrics 34, 74–82.

    Article  MATH  Google Scholar 

  • Jewell NP, Kalbfleisch JD. (1992). Marker models in survival analysis and applications to issues associated with AIDS. In: Jewell NP, Dietz K, Farewell VT, eds. AIDS Epidemiology: Methodological Issues, Birkhäuser, Boston, 211–230.

    Chapter  Google Scholar 

  • Jewell NP, Dietz K, Farwell VT. (1992). AIDS Epidemiology: Methodological Issues, Birkhäuser, Boston.

    Book  Google Scholar 

  • Lefkopoulou M, Zelen M. (1992). Intermediate clinical events, surrogate markers and survival. Technical Report 742Z, Dana-Farber Cancer Institute.

    Google Scholar 

  • Normand S-L, and Doksum K.A. (1994). Nonparametric calibration methods for longitudinal data. Technical Report #HCP-1994–3, Department of Health Care Policy, Harvard Medical School, Boston, MA.

    Google Scholar 

  • Winkelstein W Jr, Lyman DM, Padian N, Grant R, Samuel M, Anderson RE, Lang W, Riggs J, Levy JA (1987). Sexual practices and risk of infection by the human immunodeficiency virus. J Am Med Assoc. 257, 321–325.

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 1996 Springer Science+Business Media Dordrecht

About this chapter

Cite this chapter

Doksum, K.A., Normand, SL.T. (1996). Models for Degradation Processes and Event Times Based on Gaussian Processes. In: Jewell, N.P., Kimber, A.C., Lee, ML.T., Whitmore, G.A. (eds) Lifetime Data: Models in Reliability and Survival Analysis. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-5654-8_13

Download citation

  • DOI: https://doi.org/10.1007/978-1-4757-5654-8_13

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4419-4753-6

  • Online ISBN: 978-1-4757-5654-8

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics