The Basic Principles of Electron Energy Loss Spectroscopy
Electron Energy Loss Spectroscopy (EELS) is the study of the energy distribution of electrons which have interacted with a specimen. In the next four chapters of this book we will be examining the way in which this technique can be used, in conjunction with an electron microscope, to provide a powerful microanalytical method giving detailed quantitative information about the chemical, physical and electronic nature of our sample. In this chapter the basic physics of EELS will be discussed and the important concepts will be defined and described. The following chapters will then take these ideas and apply them in the contexts of biological, materials science and solid state studies.
KeywordsIncident Electron Electron Energy Loss Spectroscopy Plasmon Peak Acceptance Angle Electron Energy Loss Spectrum
Unable to display preview. Download preview PDF.
- Egerton, R.F. (1978b), “Quantitative Energy-Loss Spectroscopy,” Proc. 11th Annual SEM Symposium ( Chicago: SEM Inc. ) 1, 13–23.Google Scholar
- Egerton, R.F., Philips, J. and Whelan, M.J. (1975), “Applications of Energy Analysis in a TEM,” Developments in Electron Microscopy and Analysis (ed. J. Venables) ( London: Academic Press ), 137–41.Google Scholar
- Studies of pre-ionization structures. See also Egerton, R.F. and Whelan, M.J. (1974), “The Electron Energy Loss Spectrum and Band Structure of Diamond,” Phil. Mag. 30, 739.Google Scholar
- Egerton, R.F. and Whelan, M.J. (1974b), “High Resolution Micro-Analysis of Light Elements by Electron Energy Loss Spectrometry,” Proc. 8th Int. Cong. on Electron Microscopy ( Canberra: Australian Acad. Sciences ) 1, 384–5.Google Scholar
- Ferrier, R.P. and Hills, R.P.T. (1974), “Selected Area Electron Spectroscopy,” Advances in Analysis of Microstructural Features by Electron Beam Techniques ( London: Metals Society ), 41–66.Google Scholar
- Isaacson, M. (1978), “All You Wanted to Know About ELS and Were Afraid to Ask,” Proc. 11th Ann. SEM Symposium ( Chicago: SEM Inc. ) 1, 763–76.Google Scholar
- Jouffrey, B. (1978), “Electron Energy Losses with Special Reference to HVEM,” Short Wavelength Microscopy ( New York: N.Y. Acad. Sci. ) 29–46.Google Scholar
- Maher, D.M., Joy, D.C., Egerton, R.F. and Mochel, P. (1979), “The Functional Form of the Energy Differential Cross-Sections for Carbon,” J. Appl. Phys. (to be published) and also see Proc. Specialist Workshop on Analytical Electron Microscopy, Ithaca, N.Y. (Cornell University), Materials Research Laboratory Report 3082 (1978), 236–41.Google Scholar
- Maher, D.M., Mochel, P. and Joy, D.C. (1978), “A Data Collection and Reduction System for Energy-Loss Spectroscopy,” Proc. 13th Ann. Conf. Microbeam Analysis Society (Ann Arbor: Kyser), 53A-G.Google Scholar