Introduction to Analytical Electron Microscopy pp 437-480 | Cite as
Radiation Effects in Analysis of Inorganic Specimens by TEM
Abstract
In the practice of analytical electron microscopy, particularly at near-atomic resolution, one is forced by the exigencies of statistics and the briefness of the encounter between fast electrons and the specimen, to use upwards of 104 electrons per Å2 in order to acquire information about the identity and position of a single atom (see Sec. 17.6). It is not therefore surprising that, in addition to the “elastic” interaction which provides positional information and the “inelastic” interaction which provides chemical identification, there should be the further prospect of a significant perturbation of the atomic structure under analysis. Such perturbations may be generically labelled radiation effects and, where they lead to permanent alterations in atomic structure, can be sensibly termed radiation damage.
Keywords
Radiation Effect Fast Electron Dislocation Loop Displacement Energy Frenkel PairPreview
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