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Stem Imaging of Crystals and Defects

  • Chapter
Introduction to Analytical Electron Microscopy

Abstract

Crystals are like people: it is the defects in them which tend to make them interesting! This chapter describes the use of STEM imaging for the structural characterization of crystalline materials, perfect and imperfect. The object of the chapter is to describe basic principles as clearly as possible, using a minimum of mathematics.

On leave from Department of Metallurgy and Science of Materials, University of Oxford, Oxford, England.

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References

  • Anstis, G. R. and Cockayne, D. J. H., 1979, Acta Cryst., (in press).

    Google Scholar 

  • Booker, G. R., Joy, D. C. Spencer, J. P., Harrach, H. Graf von, and Thompson M. N., 1974, Proc. Sevent Ann. Symp. on Scanning Microsc., ed. Om Johari, IIT Res. Inst., Chicago, p. 225.

    Google Scholar 

  • Booker, G. R., Joy, D. C., Spencer, J. P. and Humphreys, C. J., 1973, Proc. 6th Ann. Symp. on Scanning Microsc., ed. Om Johari, IIT Research Institute, Chicago, p. 251.

    Google Scholar 

  • Brown, L. M., 1977, in Developments in Electron Microscopy and Analysis, 1977, ed. D. L. Misell, The Inst. of Physics, Bristol and London, p. 141.

    Google Scholar 

  • Brown, L. M. Craven, A. H., Jones, L. G. P., Griffith, A., Stobbs, W. M. and Wilson, C. J., 1976 in Scanning Electron Microscopy/1976, ed. Om Johari, IIT Research Institute, Chicago, p. 353.

    Google Scholar 

  • Cockayne, D. J. H., Ray, I. L. F., and Whelan, M. J., 1969, Phil. Mag., 20, 1265.

    Article  CAS  Google Scholar 

  • Colliex, C., Craven, A. J. and Wilson, C. J., 1977, Ultramicroscopy, 2, 327.

    Article  CAS  Google Scholar 

  • Cowley, J. M., 1969, Appl. Phys. Lett., 15, 58.

    Article  Google Scholar 

  • Cowley, J. M., 1975, “Diffraction Physics”, North Holland, Amsterdam.

    Google Scholar 

  • Cowley, J. M., 1976, Ultramicroscopy, 2, 3.

    Article  CAS  Google Scholar 

  • Cowley, J. M., 1977, in High Voltage Electron Microscopy, 1977, eds. T. Imura and H. Hashimoto, Japanese Society Electron Microsc., Kyoto, p. 9.

    Google Scholar 

  • Cowley, J. M. and Spence, J. C. H., 1979, ULtramicroscopy, 3, 433.

    Article  Google Scholar 

  • Crewe, A. V. and Wall, J., 1970, Optik, 30, 461.

    Google Scholar 

  • Frazer, H. L. and Jones, I. P., 1975, Phil. Mag., 31, 225.

    Article  Google Scholar 

  • Frazer, H. L., Jones, I. P. and Loretto, M. H., 1977, Phil. Mag., 35, 159.

    Article  Google Scholar 

  • Grinton, G. and Cowley, J. M., 1971, Optik, 34, 221.

    Google Scholar 

  • Groves, T., 1975, Ultramicroscopy, 1, 15.

    Article  CAS  Google Scholar 

  • Hashimoto, H., 1964, J. Appl. Phys., 35, 277.

    Article  Google Scholar 

  • Head, A. K., 1969, Aust. J. Phys., 22, 345.

    Article  Google Scholar 

  • Head, A. K., Humble, P., Clarebrough, C. M., Morton, A. J. and Forwood, C. J., 1973, “Computed Electron Micrographs and Defect Identification”, North Holland, Amsterdam.

    Google Scholar 

  • Hirsch, P. B., Howie, A., Nicholson, R. B., Pashley, D. W., and Whelan, M. J., 1977, “Electron Microscopy of Thin Crystals”, Krieger, New York.

    Google Scholar 

  • Hirsch, P. B., Howie, A. and Whelan, M. J., 1960, Phil. Trans. Roy. Soc., A252, 499.

    Article  Google Scholar 

  • Hirsch, P. B., and Humphreys, C. J., 1968, Proc. Fourth Eur. Reg. Conf. on Electron Microsc., Rome, p. 49.

    Google Scholar 

  • Howie, A., 1963, Proc. Roy. Roc., A271, 268.

    Article  CAS  Google Scholar 

  • Howie, A., and Basinski, Z. S., 1968, Phil. Mag., 17, 1039.

    Article  Google Scholar 

  • Humphreys, C. J., 1979, Rep. Prog. Phys. (in press).

    Google Scholar 

  • Humphreys, C. J. and Drummond, R. A., 1976a, Proc. Sixth Eur. Cong. on Electron Microsc., Jerusalem, p. 176.

    Google Scholar 

  • Humphreys, C. J. and Drummond, R. A., 1976b, Proc. Sixth Eur. Reg. Conf. on Electron Microsc., Jerusalem, p. 142.

    Google Scholar 

  • Humphreys, C. J. and Drummond, R. A., 1977, Developments in Electron Microscopy and Analysis, 1977, ed. D. L. Misell, The Inst. of Physics, Bristol and London, p. 241.

    Google Scholar 

  • Humphreys, C. J. and Hirsch, P. B., 1968, Phil. Mag., 18, 115.

    Article  CAS  Google Scholar 

  • Humphreys, C. J., Thomas, L. E., Lally, J. S., and Fisher, R. M., 1971, Phil. Mag., 23, 87.

    Article  CAS  Google Scholar 

  • Humphryes, C. J. and Whelan, M. J., 1969, Phil Mag., 20, 165.

    Article  Google Scholar 

  • Joy, D. C., 1974, Advances in Analysis of Microstructural Features by Electron Beam Techniques ( Metals Soc. London ), p. 20.

    Google Scholar 

  • Joy, D. C. and Maher, D. M., 1976, Proc. Sixth Eur. Cong. on Electron Microsc., Jerusalem, 1, 170.

    Google Scholar 

  • Joy, D. C., Maher, D. M., and Cullis, A. G., 1976, J. Microsc., 108, 185.

    Article  Google Scholar 

  • Jouffrey, B. and Taupin, D., 1967, Phil. Mag., 16, 703.

    Article  Google Scholar 

  • Laue, M. von, 1935, Ann. Phys., 23, 705.

    Article  Google Scholar 

  • Maher, D. M. and Joy, D. C., 1976, Ultramicroscopy, 1, 239.

    Article  CAS  Google Scholar 

  • Pogany, A. P. and Turner, P. S., 1968, Acta Cryst., A24, 103.

    Article  CAS  Google Scholar 

  • Rez, P., Humphreys, C. J. and Whelan, M. J., 1977, Phil. Mag., 35, 81.

    Article  CAS  Google Scholar 

  • Rose, A., 1948, Adv. in Electronics, 1, 131.

    Google Scholar 

  • Sellar, J. R. and Cowley, J. M., 1973, Proc. 6th Ann. Symp. on Scanning Microsc., ed. Om Johari, IIT Research Institute, Chicago, p. 243.

    Google Scholar 

  • Spence, J. C. H., 1978, Acta Cryst., A34, 112.

    Article  Google Scholar 

  • Spence, J. C. H., and Cowley, J. M., 1978, Optik, 50, 129

    Google Scholar 

  • Treacy, M. M. J., Howie, A., and Wilson, C. J., 1979, Phil. Mag., (in press).

    Google Scholar 

  • Whelan, M. J. and Hirsch, P. B., 1957, Phil. Mag., 2, 1307.

    Google Scholar 

  • Zeitler, E. and Thompson, M. G. R., 1970, Optik, 31, 258.

    Google Scholar 

Classic References

  • Cowley, J. M., 1975, “Diffraction Physics,” North Holland, Amsterdam.

    Google Scholar 

  • Hirsch, P. B., Howie, A., Nicholson, R. B., Pashley, D. W. and Whelan, M. J., 1977, “Electron Microscopy of Thin Crystals”, Krieger, New York.

    Google Scholar 

  • Humphreys, C. J., 1979, “The Scattering of Fast Electrons by Cry tals”, Rep. Prog. Phys. (in press).

    Google Scholar 

  • Cowley, J. M., 1969, Appl. Phys,. Lett., 15, 58.

    Article  Google Scholar 

  • Cowley, J. M., 1976, Ultramicroscopy, 2, 3.

    Article  CAS  Google Scholar 

  • Pogany, A. P. and Turner, P. S., 1968, Acta Cryst., A24, 103.

    Article  CAS  Google Scholar 

  • Pogany and Turner (1968) uses reciprocity to deduce a large amount of information concerning CTEM images. It is not an easy paper to read but it demonstrates the power of the reciprocity principle and it repays careful study. COWLEY (1969) is a short definitive letter relating STEM to CTEM by reciprocity. COWLEY (1976) examines the question of reciprocity for finite sources and detectors, coherent and incoherent.

    Google Scholar 

  • Booker, G. R., Joy, D. C., Spencer, J. P. and Humphreys, C. J., 1973, Proc. 6th Ann. SEM Symposium, Chicago, p. 251.

    Google Scholar 

  • Booker, G. R., Joy, D. C., Spencer, J. P., Harrach, H. Graf. von, and Thompson, M. N., 1974, Proc. 7th Ann. SEM Symposium, Chicago, p. 225.

    Google Scholar 

  • Maher, D. M., and Joy, D. C., 1976, Ultramicroscopy, 1, 239.

    Article  CAS  Google Scholar 

  • Frazer, H.C., Jones, J. P. and Loretto, M. H., 1977, Phil. Mag., 35, 159.

    Article  Google Scholar 

  • Spence, J. C. H. and Cowley, J. M., 1978, Optik, 50, 129. The theory of producing lattice fringe images in STEM.

    Google Scholar 

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Author information

Authors and Affiliations

  1. Department of Physics, Arizona State University, Tempe, Arizona, 85281, USA

    C. J. Humphreys

Authors
  1. C. J. Humphreys
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Editor information

Editors and Affiliations

  1. University of Florida, Gainesville, Florida, USA

    John J. Hren

  2. Lehigh University, Bethlehem, Pennsylvania, USA

    Joseph I. Goldstein

  3. Bell Laboratories, Murray Hill, New Jersey, USA

    David C. Joy

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© 1979 Springer Science+Business Media New York

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Humphreys, C.J. (1979). Stem Imaging of Crystals and Defects. In: Hren, J.J., Goldstein, J.I., Joy, D.C. (eds) Introduction to Analytical Electron Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-5581-7_11

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  • DOI: https://doi.org/10.1007/978-1-4757-5581-7_11

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4757-5583-1

  • Online ISBN: 978-1-4757-5581-7

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