Electronics in Experimental Physics pp 98-101 | Cite as
Infrared Television Microscope for the Investigation of Recombination Radiation and the Optical Properties of Semiconductors
Chapter
Abstract
In the present article we describe an infrared television microscope suitable for investigations of the recombination radiation and optical properties of semiconductors in the wavelength range from 0.5 to 2.3 μ.
Keywords
Recombination Radiation Generation Regime Resolve Power Spontaneous Emission Spectrum Subthreshold Regime
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Literature Cited
- 1.N. I. Murashov and G. D. Shnyrev, Photoelectric Infrared Polaroscopic and Flaw Detection Techniques in Semiconductor Materials, Collection edited by V. I. Grechushnikov, Izd. AN SSSR (1963), p. 40.Google Scholar
- 2.O. Deutschbein and M. Bernard, Solid State Physics, Semiconductors, 1: 117 (1960).Google Scholar
Copyright information
© Springer Science+Business Media New York 1970