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Abstract

The aim of this final chapter is to illustrate how the instrumentation, theory, and techniques described earlier are combined to extract practical information from electron-microscope specimens. Brief experimental details are given where necessary to show how the technique has been applied in specific cases. As in previous chapters, we begin with low-loss spectroscopy and energy filtering, proceed to elemental analysis and mapping, and then discuss how structural information about a specimen is obtained by analyzing fine structure of the energy-loss spectrum. The final section shows how many of these techniques have been used to investigate particular problems in materials science and biology. Table 5.1 summarizes the various types of information obtainable by EELS and by alternative high-resolution methods.

Keywords

Inelastic Scattering Scanning Transmission Electron Microscope Chromatic Aberration Plasmon Peak Scanning Transmission Electron Microscope Image 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media New York 1996

Authors and Affiliations

  • R. F. Egerton
    • 1
  1. 1.University of AlbertaEdmontonCanada

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