# Defect Oriented Analog Testing

Chapter

## Abstract

Analog circuits due to their non-binary operation are influenced by process defects in a different manner compared to digital circuits. Seemingly an innocuous defect for digital logic may cause unacceptable degradation in analog circuit performance. This chapter surveys the advances in the field of defect oriented analog testing and summarizes strengths and weaknesses of the method for analog circuits.

## Keywords

Analog Circuit Test Vector Digital Circuit Fault Coverage Fault Simulation
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