Abstract
The IEEE 1149.4 standard mandates no test methods or metrologies. Rather, the standard provides an architecture for controlling a set of minimum geometry switches within an IEEE 1149.4 compliant device. The issue of which test metrology and instrumentation to use has been left to the test engineer. This chapter focuses on one test method, structural testing, and the instrumentation needed for this method.
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© 1999 Springer Science+Business Media Dordrecht
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McDermid, J. (1999). Structural Testing. In: Osseiran, A. (eds) Analog and Mixed-Signal Boundary-Scan. Frontiers in Electronic Testing, vol 16. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-4499-6_6
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DOI: https://doi.org/10.1007/978-1-4757-4499-6_6
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4419-5115-1
Online ISBN: 978-1-4757-4499-6
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