The Boundary-Scan standard

ANSI/IEEE Std 1149.1
  • Colin M. Maunder
  • Rodham E. Tulloss
Part of the Frontiers in Electronic Testing book series (FRET, volume 16)


ANSI/IEEE Std 1149.1 defines a standard implementation of boundary-scan now built into many catalog and application-specific integrated circuits. The standard was developed as a solution to two continuing trends that are having a significant, adverse, impact on the task of testing loaded printed wiring boards: increasing chip complexity and greater miniaturization. The former increases the difficulty of test generation, while the latter impedes access for the bed-of-nails and hand-held probes on which many established test techniques depend.


System Logic Controller State Current Instruction Instruction Register Bypass Register 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


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Copyright information

© Springer Science+Business Media Dordrecht 1999

Authors and Affiliations

  • Colin M. Maunder
    • 1
  • Rodham E. Tulloss
    • 2
  1. 1.British Telecom Advanced CommunicationsUK
  2. 2.RooseveltUSA

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