The Boundary-Scan standard
ANSI/IEEE Std 1149.1 defines a standard implementation of boundary-scan now built into many catalog and application-specific integrated circuits. The standard was developed as a solution to two continuing trends that are having a significant, adverse, impact on the task of testing loaded printed wiring boards: increasing chip complexity and greater miniaturization. The former increases the difficulty of test generation, while the latter impedes access for the bed-of-nails and hand-held probes on which many established test techniques depend.
KeywordsSystem Logic Controller State Current Instruction Instruction Register Bypass Register
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