Techniques for the Investigation of Nonradiative Processes

  • U. M. Grassano
Part of the NATO ASI Series book series (NSSB, volume 249)


Nonradiative processes are generally studied by measuring the time delay of the emission or the change in the quantum yield that they introduce in the radiative processes. Nonradiative processes induced by external perturbations (concentration of defects, electric and magnetic fields, temperature...) are slower than the intrinsic processes. Among the latter are of particular interest, the intraconfigurational relaxations and the relaxations among the higher excited states of impurities and defects in ionic solids. The measurements of these processes has been made possible by the techniques of the ultrafast spectroscopy. Detailed description will be made of the techniques of pump and probe (with mode-locked lasers with picosecond and subpicosecond pulses), of streak camera and of phase correlation (with periodically modulated sources). Other nonradiative processes are excited by high energy photons. They produce the ejection from the sample of electrons (photoemission and Auger effect) or of atoms and ions related to the production of localized lattice defects.


Pump Pulse Color Center External Perturbation Streak Camera High Excited State 
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  1. 1.
    R. Englman, Nonradiative decay of ions and molecules in solids, North -Holland, Amsterdam (1979).Google Scholar
  2. 2.
    Di Bartolo (ed.), Radiationless processes, Plenum Press, New York (1980).Google Scholar
  3. 3.
    U.M. Grassano and N. Terzi (eds), Excited-state spectroscopy in solids, North-Holland, Amsterdam (1987).Google Scholar
  4. 4.
    L. Bosi, C. Bussolati and G. Spinolo, Phys. Rev., B1, 890 (1970).ADSGoogle Scholar
  5. 5.
    G. Chiarotti and U.M. Grassano, Phys. Rev. Lett., 16, 124 (1966) and Nuovo Cimento, 46, 78 (1966).ADSCrossRefGoogle Scholar
  6. 6.
    L.F. Mollenauer, Phys. Rev. Lett., 43, 1524 (1979).CrossRefGoogle Scholar
  7. 7.
    F. Porret and F. Luty, Phys. Rev. Lett., 26, 843 (1971).Google Scholar
  8. 8.
    H.S. Kiliaan and G. Blasse in Proc. Symp. Luminescence Science and Technology, (C.W. Struck, B. Di Bartolo and W.M. Yen eds.), Electrochemical Soc. Inc. (1988), pag. 211.Google Scholar
  9. 9.
    M. Schubert and K. Vogler, Phys. Stat. Sol. (b), 101, 267 (1980).Google Scholar
  10. 10.
    S. Belke, M. Schubert and K. Vogler, Optics Commum., 38, 369 (1981).ADSCrossRefGoogle Scholar
  11. 11.
    C. Sierens, W. Joosen and D. Schoemaker, Phys. Rev., B37, 3075 (1988).Google Scholar
  12. 12.
    M. Leblans, W. Joosen and D. Schoemaker, Phys. Rev. (in press).Google Scholar
  13. 13.
    G. Baldacchini, D. Pan and F. Luty, Phys. Rev., B24, 2174 (1981).Google Scholar
  14. 14.
    A. Ranfagni, D. Mugnai and R. Englman, Phys. Rev., B23, 4140 (1981).Google Scholar
  15. 15.
    N. Terzi, J. Luminescence, 31/32, 194 (1984).Google Scholar
  16. 16.
    J.M. Wiesenfeld, L.F. Mollenauer and E.P. Ippen, Phys. Rev. Lett., 47, 1668 (1981).ADSCrossRefGoogle Scholar
  17. 17.
    H. Mahr and M. Hirsch, Optics Commun., 13, 96 (1975).ADSCrossRefGoogle Scholar
  18. 18.
    L.F. Mollenauer, J.M. Wiesenfeld and E.Y. Ippen, Radiat. Effects, 72, 73 (1983).CrossRefGoogle Scholar
  19. 19.
    W.H. Knox, L.F. Mollenauèr and R.L. Fork in Ultrafast Phenomena V, (G.R. Fleming and A.E. Siegman eds.), Springer Verlag, Berlin (1986), pag. 277.Google Scholar
  20. 20.
    W.H. Knox and K.J. Teegarden, J. Luminescence, 31/32, 39 (1984).Google Scholar
  21. 21.
    V. Bruckner, B. Schröder and K. Vogler, Optics Commun., 45, 52 (1983).ADSCrossRefGoogle Scholar
  22. 22.
    W. Knox and G. Mourou, Optics Commun., 37, 203 (1981).ADSCrossRefGoogle Scholar
  23. 23.
    W.II. Knox in Excited-state spectroscopy in solids, (U.M. Grassano and N. Terzi eds.), North-Holland, Amsterdam (1987), pag. 355.Google Scholar
  24. 24.
    B. Nikolaus and K. Schmitt, Appl. Phys., B36, 213 (1985).Google Scholar
  25. 25.
    R.D. Spencer and G. Weber, Ann. N.Y. Acad. Sci, 158, 361, (1969).Google Scholar
  26. 26.
    U.M. Grassano, M. Piacentini and N. Zema, Nuovo Cimento, 7D, 379 (1986).Google Scholar
  27. 27.
    J.R. Lakowicz, G. Laczko and I. Gryczynski, Rev. Sci Instrum., 57, 2499 (1986).ADSCrossRefGoogle Scholar
  28. 28.
    E. Gratton, D.M. Jameson, N. Rosato and G. Weber, Rev. Sci Instrum., 55, 486 (1984).ADSCrossRefGoogle Scholar
  29. 29.
    A. Nakamura, T. Sano, K. Kondo and M. Hirai, J. Phys. Soc. Japan, 56, 1603 (1987).ADSCrossRefGoogle Scholar
  30. 30.
    Y. Mori, R. Hattori and H. Ohkura, J. Phys. Soc. Japan, 51, 2713 (1982).ADSCrossRefGoogle Scholar
  31. 31.
    Y. Kondo, T. Noto, S. Sato, M. I-lirai and A. Nakamura, J. Luminescence, 38, 164 (1987).ADSCrossRefGoogle Scholar
  32. 32.
    V.V. Hizhnyakov, Phys. Stat. Sol., (b)114, 721 (1982).Google Scholar
  33. 33.
    A. Freiberg, S. Savikhin and A. Anijalg, Optics Commun., 49, 34 (1984).ADSCrossRefGoogle Scholar
  34. 34.
    G.S. Zavt, V.G. Plekhanov, V.V. Khizhnyakov and V.V. Shepelev, JEPT Lett., 36, 288 (1982).ADSGoogle Scholar
  35. 35.
    A. Mabud and F. Luty, Proc. Int. Conf. Defects in Insulating Crystals, Salt Lake City (1984), pag. 297.Google Scholar
  36. 36.
    P. Hess and J. Pelz1 (eds.), Photoacustic and photothermal phenomena, Springer, Berlin (1988).Google Scholar
  37. 37.
    Ch. B. Lushchik, I.K. Vitol and M.A. Elango, Soy. Phys. Usp., 20, 489 (1977).ADSCrossRefGoogle Scholar
  38. 38.
    N. Itoh, Adv. Phys., 31, 491 (1982).ADSCrossRefGoogle Scholar
  39. 39.
    R.T. Williams, K.S. Song, W.L. Faust and C.H. Leung, Phys. Rev., B33, 7232 (1986).Google Scholar
  40. 40.
    M. Hirai, Y. Suzuki, H. Hattori, T. Ehara and E. Kitamura, J. Phys. Soc. Japan, 56, 2948 (1987).Google Scholar
  41. 41.
    M. Elango, C. Gahwiller and F.C. Brown, Solid State Commun., 8, 893 (1970).ADSCrossRefGoogle Scholar
  42. 42.
    F.C. Brown, B.R. Sever, N. Kristianpoller and J.P. Stott, Physica Scripta, 35, 582 (1987).ADSCrossRefGoogle Scholar
  43. 43.
    T.O. Woodruff, Semicond. and Insul., 5, 431 (1983).Google Scholar
  44. 44.
    T.R. Pian, M.M. Traum, J.S. Kraus, N.H. Tolk, N.G. Stoffel and G. Margaritondo, Surface Sci., 128, 13 (1983).Google Scholar
  45. 45.
    R.F. Haglund et al., Nucl. Instrum. Meth., B13, 525 (1986).Google Scholar
  46. 46.
    L. Ley and M. Cardona, Photoemission in Solids, vol. I and II, Springer, Berlin (1979).Google Scholar
  47. 47.
    G. Margaritondo and J.M. Rowe in Treatise on Analitical Chemistry, (I.M. Kolthoff and P.Y. Elving eds.), J. Wiley, New York (1986), part I, vol. 8, ch. 17.Google Scholar

Copyright information

© Springer Science+Business Media New York 1991

Authors and Affiliations

  • U. M. Grassano
    • 1
  1. 1.Dipartimento di FisicaUniversità di Roma — Tor VergataRomaItaly

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