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Simulating Images of Thick Specimens

  • Earl J. Kirkland

Abstract

This chapter discusses how to simulate images of thick specimens including the effects of multiple or plural scattering in the specimen and the geometrical extent of the specimen along the optic axis of the electron microscope (the z direction). The electron interacts strongly with the specimen and can scatter more than once as it passes through specimens as thin as 10 to 50A. When the electron can scatter more than once as it passes through the specimen the scattering is said to be dynamical. If the electron can only scatter once when passing through the specimen the scattering is said to be kinematical. The electron interaction in chapter 5 is kinematical and the scattering processes discussed in this chapter are dynamical. Dynamical scattering also exists in X-ray diffraction (Batterman and Cole137) of thick specimens.

Keywords

Wave Function Fast Fourier Transform Reciprocal Space Transmission Function Electron Wave Function 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Earl J. Kirkland 1998

Authors and Affiliations

  • Earl J. Kirkland
    • 1
  1. 1.Cornell UniversityIthacaUSA

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