Abstract
The modern transmission electron microscope has evolved over most of this century into a rather complex instrument. The Conventional Transmission Electron Microscope (CTEM) was first invented in the early 1930’s by Knoll and Ruskal6 as an extension of earlier work to perfect the oscilloscope. Early microscopes had a resolution that was no better than a light microscope but there was considerable speculation at the time that atomic resolution should be possible. These speculations have been realized in current commercial instruments. For his work on the CTEM, Ruska shared the 1986 Nobel prize in physics with G. Binnig and H. Rohrer for their invention of the scanning tunneling microscope (STM). The Scanning Transmission Electron Microscope (STEM) was invented shortly after the CTEM in the late 1930’s by von Ardenne17. The utility of the STEM was greatly increased in the late 1960’s by Crewels et al with the addition of a cold field emission gun (FEG) source with a small source size and high brightness. The beginning chapters of Heidenreich19 or Ha1120 and the two contributed volumes edited by Hawkes21 and Mulvey22 have a more complete historical discussion of the transmission electron microscope.
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Further Reading
Some Books on Electron Microscopy
P.R. Buseck, J.M. Cowley and L. Eyring, edit., High-Resolution Transmission Electron Microscopy,Oxford Univ. Press, 198849
D.K. Bowen and C. R. Hall, Microscopy of Materials,MacMillan Press, 197550
J. W. Edington, Practical Electron Microscopy in Materials Science,Van Nostrand Reinhold, 197651
C. E. Hall,Introduction to Electron Microscopy,2nd edition, McGraw-Hill, 196620
P. W. Hawkes, Electron Optics and the Electron Microscope,Taylor and Francis, 197252
R.D. Heidenreich, Fundamentals of Transmission Electron Microscopy,Wiley, 196419
P. Hirsch, A. Howie, R. B. Nicholson, D. W. Pashley, M. J. Whelan, Electron Microscopy of Thin Crystals, second edition,Krieger, 197753
S. Horiuchi, Fundamentals of High Resolution Transmission Electron Microscopy,North-Holland, 199454
G. A. Meek, Practical Electron Microscopy for Biologists, second edition,Wiley, 197655
L. Reimer, Transmission Electron Microscopy, third edition, Springer-Verlag,199356
L. Reimer, Scanning Electron Microscopy,Springer-Verlag, 198557
B. M. Siegel and D. R. Beaman, edit., Physical Aspects of Electron Microscopy and Microbeam Analysis,Wiley, 197558
J.C. H. Spence, Experimental High-Resolution Electron Microscopy,Oxford University Press, 198159
D. B. Williams and C. B. Carter, Transmission Electron Microscopy, A Textbook for Materials Science,Plenum Press, 199660
Some Books on Electron Optics
P. Grivet,Electron Optics, Parts 1 and 2, 2nd english edition, Pergamon, 197261
P. W. Hawkes and E. Kasper, Principles of Electron Optics, Vol. 1,2,3,Academic Press,1989, 199410,11,36
O. Klemperer and M. E. Barnett, Electron Optics, third edition,Cambridge Univ. Press, 197162
A. B. El-Kareh and J. C. J. El-Kareh,Electron Beams Lenses and Optics Vol. 12, Academic Press, 197063
A. Septier, editor, Applied Charged Particle Optics,in: Adv. in Electronics and Electron Physics, Vol. 13A,B, Academic Press, 198064
V. K. Zworykin, G. A. Morton, E. G. Ramberg, J. Hillier, A. W. Vance, Electron Optics and the Electron Microscope, Wiley, 194565
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© 1998 Earl J. Kirkland
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Kirkland, E.J. (1998). The Transmission Electron Microscope. In: Advanced Computing in Electron Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-4406-4_2
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DOI: https://doi.org/10.1007/978-1-4757-4406-4_2
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