Abstract
AFM and MFM (Mamin et al., 1989) have been extensively used for both qualitative and quantitative analysis of surface morphologies and magnetic microstructures of magnetic media. Quantitative analysis provides important information in the study of high density recording media.
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© 2003 Springer Science+Business Media New York
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Li, J.M., Lü, L., Lai, M.O., Ralph, B. (2003). Fractal-based Study of Magnetic Thin Films. In: Image-Based Fractal Description of Microstructures. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-3773-8_10
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DOI: https://doi.org/10.1007/978-1-4757-3773-8_10
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4419-5370-4
Online ISBN: 978-1-4757-3773-8
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