A Framework for the SCTA Family

  • J. Rouquerol
  • O. Toft Sorensen
Part of the Hot Topics in Thermal Analysis and Calorimetry book series (HTTC, volume 3)


Figure 2–1 provides a simple representation of thermal analysis in general, where a physical property “X” of sample “S” is recorded vs. temperature “T”, as the sample is heated or cooled. As we know, this physical property can be a mass, a heat content, a length, or any other mechanical, electrical or optical property. Because this is a general representation, encompassing any type of thermal analysis, nothing is indicated about the possible modes of heating control.


Thermal Analysis Transformation Rate Thermal Transformation Heating Control Constant Decomposition Rate 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.


  1. 1.
    M. Reading, in “Thermal Analysis, Techniques and Applications” E.L. Charsley and S.B. Warrington (Eds.), Royal Society of Chemistry, Cambridge (1992) 126.Google Scholar
  2. 2.
    C.S. Smith, Trans. A.I.M.E. (Metal Division) 137 (1940) 23.Google Scholar
  3. 3.
    J. Rouquerol, Bull. Soc. Chim. Fr. (1964) 31.Google Scholar
  4. 4.
    H. Palmour and D.R. Johnson, in “Sintering and Related Phenomena”, G.C. Kuczynski, N.A. Hooton and C.F. Gibbon (Eds.), Gordon and Breach, New York (1967) 779.Google Scholar
  5. 5.
    J. Rouquerol, J. Therm. Anal. 1 (1969) 281.Google Scholar
  6. 6.
    J. Rouquerol, J. Therm. Anal. 2 (1970) 123.CrossRefGoogle Scholar
  7. 7.
    J. Paulik and F. Paulik, Anal. Chim. Acta 56 (1971) 328.CrossRefGoogle Scholar
  8. 8.
    L. Erdey, F. Paulik and J. Paulik, Hungarian Patent No. 152197, registered 31 October 1962, published 1 December 1965.Google Scholar
  9. 9.
    M. Ganteaume and J. Rouquerol, J. Therm. Anal. 3 (1971) 413.CrossRefGoogle Scholar
  10. 10.
    J. Paulik and F. Paulik, Proc. 5th Int. Conf. Thermal Analysis (Kyoto), Heyden, London, 1 (1977) 75.Google Scholar
  11. 11.
    O.T. Sorensen, J. Therm. Anal. 13 (1978) 429.CrossRefGoogle Scholar
  12. 12.
    J. Paulik, F. Paulik and M. Arnold, Hungarian Patent No. 194.405/1985.Google Scholar
  13. 13.
    J. Paulik, “Special Trends in Thermal Analysis”, John Wiley and sons, Chichester, New York (1995) p. 232.Google Scholar
  14. 14.
    J. Arellano, J.M. Criado and C. Real, Thermochimica Acta 134 (1988) 365.CrossRefGoogle Scholar
  15. 15.
    M.H. Stacey in “Proceedings 2nd European Symposium on Thermal Analysis” (Aberdeen), D. Dollimore (Ed.), Heyden, London, 408.Google Scholar
  16. 16.
    M.H. Stacey, Anal. Proc. 22 (1985) 242.Google Scholar
  17. 17.
    C. Real, M.D. Alcala and J.M. Criado, J. Therm. Anal. 38 (1992) 797.CrossRefGoogle Scholar
  18. 18.
    M. Reading and J. Rouquerol, Thermochimica Acta 85 (1985) 299.CrossRefGoogle Scholar
  19. 19.
    P.A. Barnes, G.M.B. Parkes, D.R. Brown and E.L. Charsley, Thermochimica Acta, 269/270 (1995) 665.CrossRefGoogle Scholar
  20. 20.
    J. Rouquerol and J.M. Fulconis, ICTAC 11 Book of Abstracts, P. Gallagher (Ed.), Philadelphia (1996) 272.Google Scholar
  21. 21.
    F. Rouquerol and J. Rouquerol in “Thermal Analysis”, H.G. Widemann, (Ed.), Vol. 1, Birkhäuser, Basel, Vol. 1, (1972) 373.Google Scholar
  22. 22.
    G. Thevand, F. Rouquerol, and J. Rouquerol in “Thermal Analysis”, B. Miller, (Ed.), John Wiley and Sons, New York, Vol. 2, (1982) 1524.Google Scholar
  23. 23.
    A. Ortega, L.A. Pérez-Maquéda and J.M. Criado, J. Therm. Anal. 42 (1994) 551.CrossRefGoogle Scholar
  24. 24.
    R.L. Blaine, Proceedings of NATAS Meeting, R.J. Morgan (Ed.) (1997) 485.Google Scholar
  25. 25.
    R.L. Blaine, American Laboratory, January 1998, 21.Google Scholar
  26. 26.
    G.M.B. Parkes, P.A. Barnes, E.L. Charsley, M. Reading and I. Abrahams, Thermochimica Acta, 354 (2000) 39.CrossRefGoogle Scholar
  27. 27.
    O.T. Sorensen in Proc. 5th Meeting of AICAT, AICAT, Trieste (1983) 25.Google Scholar
  28. 28.
    O. Toft Sorensen, J. Thermal Analysis, 38 (1992) 213.CrossRefGoogle Scholar
  29. 29.
    B. Schenker and R. Riesen, USER COM, Information for users of Mettler Toledo Thermal Analysis Systems, December 1997, 10.Google Scholar
  30. 30.
    P.S. Gill, S.R. Sauerbrunn and B.S. Crowe, J. Therm. Anal., 38 (1992) 255.CrossRefGoogle Scholar
  31. 31.
    J. Opfermann, J. Netzsch Geraetebau, Germany-private communication.Google Scholar

Copyright information

© Springer Science+Business Media Dordrecht 2003

Authors and Affiliations

  • J. Rouquerol
    • 1
  • O. Toft Sorensen
    • 2
  1. 1.Madirel LaboratoryCNRS-Université de ProvenceMarseilleFrance
  2. 2.Risoe National LaboratoryRoskildeDenmark

Personalised recommendations