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Introduction to the testing of integrated circuits

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Thermal Testing of Integrated Circuits

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Abstract

Today’s electronic technology is based on the design and manufacture of integrated circuits. The concept of the integrated circuit comes from the work of 2000 Nobel Prize winner J.S. Kilby [1]. Its origins can be dated to February 1959. In his patent declaration, Kilby defines the integrated circuit with the following statement: “this invention relates to miniature electronic circuits, and more particularly to unique integrated electronic circuits fabricated from semiconductor material”.

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Authors and Affiliations

  1. University Politècnia de Catalunya, Spain

    Josep Altet & Antonio Rubio

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  1. Josep Altet
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  2. Antonio Rubio
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© 2002 Springer Science+Business Media Dordrecht

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Altet, J., Rubio, A. (2002). Introduction to the testing of integrated circuits. In: Thermal Testing of Integrated Circuits. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-3635-9_1

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  • DOI: https://doi.org/10.1007/978-1-4757-3635-9_1

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4419-5287-5

  • Online ISBN: 978-1-4757-3635-9

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