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The Generalized Birthday Problem

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Scan Statistics

Part of the book series: Springer Series in Statistics ((SSS))

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Abstract

Many researchers deal with data that can be viewed as a series of trials, each with two possible outcomes. We will arbitrarily label the two alternative possible outcomes of a trial as success and failure. The maximum number within any m contiguous trials within the N trials, denoted S m , is called the scan statistic. For the special case where S m = m, a success run of length m has occurred within the N trials. For the general case where S m = k, a quota of at least k successes within m consecutive trials has occurred.

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© 2001 Springer Science+Business Media New York

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Glaz, J., Naus, J., Wallenstein, S. (2001). The Generalized Birthday Problem. In: Scan Statistics. Springer Series in Statistics. Springer, New York, NY. https://doi.org/10.1007/978-1-4757-3460-7_12

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  • DOI: https://doi.org/10.1007/978-1-4757-3460-7_12

  • Publisher Name: Springer, New York, NY

  • Print ISBN: 978-1-4419-3167-2

  • Online ISBN: 978-1-4757-3460-7

  • eBook Packages: Springer Book Archive

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