Abstract
Let Y t (w) denote the number of points (X’s) in the interval {t, t + w). The scan statistic \( {S_w} = \mathop {\max }\limits_{0 < t < T - w} \;\{ {Y_t}(w)\}\), denotes the largest number of points to be found in any subinterval of [0, T) of length w. Let X (1) ≤ X (2) ≤ ...,denote the ordered values of the X’s. The statistic W k ,the size of the smallest subinterval of [0, T) that contains k points, equals \( \mathop {\min }\limits_{0 \leqslant w \leqslant T} \{ w:{S_w} \geqslant k\} \; = \mathop {\min }\limits_{1 \leqslant i} \{ {X_{(i + k - 1)}} - {X_{(i)}}\}\). For the case where the N points are uniformly distributed on [0, T),the common probabilities P(S W ≥ k) = P(W k ≤ w) are denoted P(k; N, w/T). The maximum cluster S w is called the scan statistic, and the smallest interval W r+1 is called the r-scan statistic.
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© 2001 Springer Science+Business Media New York
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Glaz, J., Naus, J., Wallenstein, S. (2001). Scanning Points in a Poisson Process. In: Scan Statistics. Springer Series in Statistics. Springer, New York, NY. https://doi.org/10.1007/978-1-4757-3460-7_11
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DOI: https://doi.org/10.1007/978-1-4757-3460-7_11
Publisher Name: Springer, New York, NY
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