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Abstract

In this and the following chapter, we provide an overview of the representations of texture measurement with a particular focus on those aspects that are particularly relevant to electron backscatter diffraction (EBSD) techniques. The mathematical foundations of visualization of three-dimensional orientation and the frequency distribution of specific orientations are discussed extensively in the literature (Bunge, 1982; Wenk, 1985; Kocks, Tomé, and Wenk, 1998). The focus of the present chapter is to outline the more commonly used forms of graphical representations of texture data. We shall review three commonly used forms of texture representation in terms of sample and/or lattice plane orientation, namely, pole figures and inverse pole figures represented in terms of stereographic projections and orientation distribution functions projected in Euler space. The graphical visualization of these projections of orientation information will be discussed, especially in the context of data representation as derived from EBSD type techniques. These representations form the foundation for most texture analysis studies and will be widely used in the variety of materials science applications represented in this book.

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© 2000 Springer Science+Business Media New York

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Rajan, K. (2000). Representations of Texture in Orientation Space. In: Schwartz, A.J., Kumar, M., Adams, B.L. (eds) Electron Backscatter Diffraction in Materials Science. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-3205-4_3

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  • DOI: https://doi.org/10.1007/978-1-4757-3205-4_3

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4757-3207-8

  • Online ISBN: 978-1-4757-3205-4

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