Hardware and Software Optimization for Orientation Mapping and Phase Identification

  • Patrick P. Camus

Abstract

The advent of high-resolution, high-sensitivity charge couple device (CCD) cameras supplied with fast computers and software algorithms has permitted the routine collection and measurement of EBSD patterns for microcharacterization. Modern camera technology is required for easy acquisition of low intensity patterns and fast pattern analysis makes real-time acquisitions possible. Once the pattern is collected and the Kikuchi bands are identified, there are at least two analyses possible: orientation mapping of known crystal(s) and phase identification of unknown crystals. Although both analyses use EBSD patterns, it has been found that both the hardware and software should be optimized for these different tasks. This chapter will discuss the optimizations deemed necessary for optimal EBSD performance.

Keywords

Pole Figure Orientation Mapping Orientation Distribution Function Charge Couple Device Camera Secondary Electron Detector 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Reference

  1. International Center for Diffraction Data, 12 Campus Blvd. Newtown Square, PA 19073–3273 USA, http://www.icdd.com.
  2. Michael, J.R., 1999, Phase identification using EBSD in the SEM: What can be done today and what we hope to do tomorrow, Microscopy and Microanalysis, 5(2):220.Google Scholar
  3. Morawiec, A., 1999, Reliability of automatic orientation determination from Kikuchi patterns, Proc. ICOTOM-12, 1:62.Google Scholar
  4. NORAN Instruments Inc. Application Note “ORKID Analysis of 304 Stainless Steel”.Google Scholar
  5. NORAN Instruments Inc. Application Note “Phase ID of Compressed Powder Sample”.Google Scholar
  6. NORAN Instruments Inc. Sales Bulletin “Forward-Scatter Electron (FSE) Images from EBSD Samples”.Google Scholar
  7. Randle, V., 1993, The Measurement of Grain Boundary Geometry, Institute of Physics Publishing, Bristol.Google Scholar
  8. Schwarzer, R.A., 1997, Automated crystal lattice orientation mapping using a computer-controlled SEM, Micron, 28:249.CrossRefGoogle Scholar

Copyright information

© Springer Science+Business Media New York 2000

Authors and Affiliations

  • Patrick P. Camus
    • 1
  1. 1.NORAN Instruments Inc.MiddletonUSA

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