Abstract
Constituive behaviour and fracture of micro solder joints are supposed to differ very much from that of bulky samples. The paper presents the results of reversible shear tests on flip chip solder joints under isothermal conditions. Two micro shear testers have been designed and built for this task. One tester is optimized to achieve high precision. The second tester works very similar but fits in a UHV chamber. This way, it enables in-situ SEM observations during the test. The experimental program included cyclic shear tests for elastic plastic material data as well as a new reversal creep and relaxation test procedure for time dependent deformation data. FEM simulation has subsequently been applied to evaluate the experimental raw data to extract material parameters according to the material models provided by ANSYS ®. Crack propagation was investigated by isothermal mechanical cycling.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
Rzepka, S.; Meusel, E.: Flip Chips directly attached to FR4 Printed Circuit Boards: FEM Simulations and Experimental Tests, Proc. ITAP(1995),San Jose, pp. 8–15
Auersperg, J.; Schubert, A.; Vogel, D.; Michel, B.; Reichl, H.: Fracture and Damage Evaluation in Chip Scale Packages and Flip-Chip-Assemblies by FEA and MicroDAC. Pro-ceedings of the Symposium on Application of Fracture Mechanics in Electronic Packaging at the 1997 ASME International Engineering Congress and Exhibition, Dallas, Nov. 16–21, 1997, AMD-Bd. 222/EEP-Bd. 20, S. 133–138
Dudek, R.; Nylen, M.; Schubert, A.; Michel, B.; Reichl, H.: An Efficient Approach to Predict Solder Fatigue Life and its Application to SM- and Area Array Components. Proceedings IEEE 47th Electronic Components and Technology Conference, 1997, S. 462–471
Jendrny, J.; Müller, W.H.; Albrecht, H.-J.: Models and Concepts for Lifetime Prediction of SMT Solder Joints: A Comparison and Critical Evaluation. Proceedings of the Micro Materials ‘87 Conference, Berlin, ddp Goldenbogen 1997, S. 907–912
Feustel, F.; Meusel, E.:“ Modellierung und Simulation von Einbaufällen”. In: Direktmontage–Handbuch über die Verarbeitung ungehäuster IC’s. Reichl, H. (Ed.). Berlin–Heidelberg–New York: Springer 1998, S. 255–261
Rzepka, S.; Feustel, F.; Meusel, E.: The Effect of Underfill Imperfections on the Reliability of Flip Chip Modules: FEM Simulations and Experiments, Proceedings IEEE 50th Electronic Components and Technology Conference, 25–28. 05. 1998, S. 362–370
Schubert, A.; Dudek, R.; Kloeser, J., Michel, B.; Reichel, H.; Hauck, T.; Kaskoun, K.: Experimental and Numerical Reliability Investigations of FCOB Assembblies with Process-induced Defects, Proceedings IEEE 50th Electronic Components and Technology Conference, 21–25. 05. 2000, S. 624–632
Feustel, F.; S.Wiese, S.; Meusel, E.: Time-Dependent Material Modeling for Finite Element Analyses of Flip Chips, Proceedings IEEE 50th Electronic Components and Technology Conference, 21–25. 05. 2000, S. 1548–1553
Wiese, S.; Feustel, F.; Rzepka, S.; Meusel, E.: Creep and Crack Propagation in Flip Chip SnPb37 Solder Joints, Proceedings IEEE 49th Electronic Components and Technology Conference, 01–04. 06. 1999, S. 1015–1020
Z. Guo; H. Conrad: Fatigue Crack Growth Rate in 63Sn37Pb Solder Joints, Trans. of the ASME Journal of Electronic Packaging, June 1993, Vol. 115, p. 159–164
Wiese, S., Feustel, F., Rzepka, S., Meusel, E.: Crack propagation experiments on flip chip solder joints. Electronic Packaging Materials Science X - MRS Symposium Proceedings, April 14–16, 1998, San Francisco, Belton, D. J., Gaynes, M., Jacobs, E. G., Pearson, R., Wu, T. (Ed.), Materials Research Society, Warrendale, Vol. 515 (1998), pp. 227–232
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2000 Springer Science+Business Media Dordrecht
About this chapter
Cite this chapter
Wiese, S., Feustel, F., Meusel, E. (2000). Solder Material Characterisation and Modelling. In: Zhang, G.Q., Ernst, L.J., de Saint Leger, O. (eds) Benefiting from Thermal and Mechanical Simulation in Micro-Electronics. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-3159-0_3
Download citation
DOI: https://doi.org/10.1007/978-1-4757-3159-0_3
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4419-4873-1
Online ISBN: 978-1-4757-3159-0
eBook Packages: Springer Book Archive