Experimental measurements performed on a mixed-signal IC
This chapter deals with experimental measurements performed on a mixed-signal test IC. These measurements allow comparison of noise performance of lightly and heavily doped wafers. The results obtained will also be used to verify the results obtained in previous chapters, particularly the ones to do with dominant coupling paths, and to validate the models used in chapter 4. Our aim is also to prove how prone circuits like A/D converters and RAM cells are to substrate noise. Some comparators commonly used by these circuits have been included in the IC (auto-zeroed, sense amplifier), and the drop in resolution produced by substrate noise will be measured.
KeywordsSupply Line Guard Ring Substrate Noise Sense Amplifier Noise Waveform
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