Abstract
Designing RF PA’s you will propably find a too large difference between simulation and measurements. Therefore accurate modeling of all used parts is needed to make simulation becoming an accurate design tool. The most important parasitic influences are identified and their modeling is shown.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
Literature
E.O. Johnson, “Physical Limitations on Frequency and Power Parameters of Transistors”, RCA Review, Vol. 26, June 1965
Ted Johansson, “Inside the RF Power Transistor, Applied Microwave & Wireless”, September/October 1997, p. 34ff
J. Crols, P. Kinget, J. Craninckx, M. Steyart. “An Analytical Model of Planar Inductors on Lowly Doped Silicon Substrates for High Frequency Analog Design up to 3GHz”, Symposium on VLSI Circuits, 1996
J.R. Long, M.A. Copeland, “The Modeling, Chracterization, and Design of Monolythic Inductors for Silicon RF IC’s”, IEEE Journal of Solid-State Circuits, Vol. 32, No. 3, March 1997, p. 357ff
H. Hasegawa, M. Furukawa, H. Yanai, “Properties of Microstrip Line on Si-SiO2 Systems”, IEEE Transactions on Microwave Theory and Techniques, November 1971, p. 869ff
K. Jodar, “A Simple Approach to Modeling Cross-Talk in Integrated Circuits”, IEEE Journal Solid-State Circuits, Vol. 29, No. 10, October 1994, p. 1212ff
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1999 Springer Science+Business Media Dordrecht
About this chapter
Cite this chapter
Weber, S. (1999). Modeling for Si-Bipolar Power Amplifiers. In: Huijsing, J., van de Plassche, R., Sansen, W. (eds) Analog Circuit Design. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-2983-2_17
Download citation
DOI: https://doi.org/10.1007/978-1-4757-2983-2_17
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4419-5071-0
Online ISBN: 978-1-4757-2983-2
eBook Packages: Springer Book Archive