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Modern Antennas pp 600–625Cite as

Antenna measurements

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Part of the book series: Microwave and RF Technology Series ((MRFT,volume 12))

Abstract

Antenna measurements are important both to the antenna designer and the antenna manufacturer. Measurement is an integral part of the design process, and the results of measurement of a prototype may be fed back to iteratively refine the design. In manufacture, it will be necessary to check that the performance of a product meets certain specifications.

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Further Reading

  1. Tuley, M.T., `Radar absorbing materials’, Chapter 8 in Radar Cross Section ( second edition ), E.F. Knott, J.F. Shaeffer and M.T. Tuley, Artech House, Dedham, MA, 1992.

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  2. Evans, G.E., Antenna Measurement Techniques, Artech House, Dedham, MA, 1990.

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  3. Olver, A.D., `Compact antenna test ranges’, Proc. 7th IEE Intl. Conference on Antennas & Propagation, York, IEE Conf. Publ. No. 333 Part I, pp 99–108, April 1991.

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  4. Wang, J.J.H., `An examination of the theory and practice of planar near-field measurement’, IEEE Trans. Antennas & Propagation, vol. AP-36, No. 6, pp 746–753, June 1988.

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  5. Special Issue of IEEE Trans. Antennas & Propagation on Near-field Scanning Techniques, Vol. AP-36, No. 6, June 1988.

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  6. IEEE Standard Test Procedures for Antennas: IEEE Std 149–1979, IEEE/Wiley Interscience, New York, 1979.

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  7. There is a series of conferences on antenna measurements, organized by the Antenna Measurement Techniques Association (AMTA),and held each year in the USA. They can be contacted via: Sally Vogliano, AMTA Secretary, do Mail Boxes Etc., 274 East Sunset Ave., #317, Suisun City, CA 94585–1822, USA.

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Author information

Authors and Affiliations

  1. Ecole Supérieure d’Electricité, France

    S. Drabowitch

  2. University of Nice-Sophia Antipolis, France

    A. Papiernik

  3. University College London, UK

    H. Griffiths

  4. formerly of the Institut Supérieure d’Electronique de Paris, France

    J. Encinas

  5. Radar and Optics Group, University College London, UK

    Hugh Griffiths (Professor and Head of Microwaves)

  6. Corporate Research Centre, Alcatel Alsthom, Paris, France

    Bradford L. Smith (Senior Intellectual Property Counsel and Engineer)

Authors
  1. S. Drabowitch
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  2. A. Papiernik
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  3. H. Griffiths
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  4. J. Encinas
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  5. Hugh Griffiths
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  6. Bradford L. Smith
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Editor information

Editors and Affiliations

  1. Radar and Optics Group, University College London, UK

    Hugh Griffiths (Professor and Head of Microwaves, Fellow of the IEE and Senior Member of the IEEE) (Professor and Head of Microwaves, Fellow of the IEE and Senior Member of the IEEE)

  2. Corporate Research Centre, Alcatel Alsthom, Paris, France

    Bradford L. Smith (Senior Intellectual Property Counsel and Engineer, Senior Member of the IEEE and French SEE) (Senior Intellectual Property Counsel and Engineer, Senior Member of the IEEE and French SEE)

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© 1998 S. Drabowitch, A. Papiernik, H. Griffiths, J. Encinas and B. L. Smith

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Cite this chapter

Drabowitch, S., Papiernik, A., Griffiths, H., Encinas, J., Griffiths, H., Smith, B.L. (1998). Antenna measurements. In: Griffiths, H., Smith, B.L. (eds) Modern Antennas. Microwave and RF Technology Series, vol 12. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-2758-6_15

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  • DOI: https://doi.org/10.1007/978-1-4757-2758-6_15

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4757-2760-9

  • Online ISBN: 978-1-4757-2758-6

  • eBook Packages: Springer Book Archive

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