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A Model for Exploring Hardware/Software Trade-offs and Evaluating Design Alternatives

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Hardware/Software Co-Design and Co-Verification

Part of the book series: Current Issues in Electronic Modeling ((CIEM,volume 8))

Abstract

To address the separation between the hardware and software domains, this chapter presents an abstract hardware/software model employing a unified representation that supports the early exploration of hardware/software trade-offs and the evaluation of design alternatives with respect to multiple metrics. Using this model, systems can be evaluated at different levels of detail, allowing those aspects of interest to be focused on. This model has been implemented in the Advanced Design Environment Prototyping Tool (ADEPT). The abstract hardware/software model is demonstrated on two examples: a “best-fit ellipse “feature extraction algorithm and a stylus tracking system.

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Author information

Authors and Affiliations

  1. Honeywell Technology Center, USA

    Sanjaya Kumar

  2. Department of Electrical Engineering, University of Virginia, USA

    James H. Aylor, Barry W. Johnson & Ronald D. Williams

  3. Department of Computer Science, University of Virginia, USA

    Wm. A. Wulf

Authors
  1. Sanjaya Kumar
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  2. James H. Aylor
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  3. Barry W. Johnson
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  4. Wm. A. Wulf
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  5. Ronald D. Williams
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Editor information

Editors and Affiliations

  1. CNET, France

    Jean-Michel Bergé

  2. Cadence Design Systems, USA

    Oz Levia

  3. ESIM, France

    Jacques Rouillard

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© 1997 Springer Science+Business Media Dordrecht

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Kumar, S., Aylor, J.H., Johnson, B.W., Wulf, W.A., Williams, R.D. (1997). A Model for Exploring Hardware/Software Trade-offs and Evaluating Design Alternatives. In: Bergé, JM., Levia, O., Rouillard, J. (eds) Hardware/Software Co-Design and Co-Verification. Current Issues in Electronic Modeling, vol 8. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-2629-9_1

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  • DOI: https://doi.org/10.1007/978-1-4757-2629-9_1

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4419-5159-5

  • Online ISBN: 978-1-4757-2629-9

  • eBook Packages: Springer Book Archive

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