Abstract
With diminishing budgets of space agencies around the World, it becomes critical to search for lower cost solutions to keep exploration programs alive. One of the cost contributing factors is the common use of rad-hard electronic devices for space applications. This paper questions this requirement by proposing an alternative which employs highly adaptable microelectronic architecture potentially absorbing the impact of space born defects. The FPGA soft programmable device under study is driven by a rad hard 80186 microprocessor. The proposed experiment, called TRIAD, enables the validation of different fault models in space borne systems, with the expectation of behavioral fault models being most attractive.
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© 1997 Springer Science+Business Media Dordrecht
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Rucinski, A., Valverde, N., Baron, C., Bisgambiglia, P., Federici, D., Santucci, JF. (1997). Fault Modeling in Space-Borne Reconfigurable Microelectronic Systems. In: Baron, C., Geffroy, JC., Motet, G. (eds) Embedded System Applications. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-2574-2_10
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DOI: https://doi.org/10.1007/978-1-4757-2574-2_10
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