Obtaining CBED Patterns

  • David B. Williams
  • C. Barry Carter


We know that SAD, while giving us useful information about the specimen, has two severe limitations:
  • We have to be very cautious in interpreting SAD patterns from areas which are less than ~0.5 lam in diameter. This size is large compared to the dimensions of many crystalline features that interest us in materials science (Chapter 16).

  • SAD patterns contain only rather imprecise two-dimensional crystallographic information because the Bragg conditions are relaxed for a thin specimen and small grains within the specimen (Chapter 17).


Zone Axis Reciprocal Lattice Diffraction Maximum Thin Specimen Kikuchi Line 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


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General References

  1. Loretto, M.H. (1994) Electron Beam Analysis of Materials, 2nd edition, Chapman and Hall, London.Google Scholar
  2. Steeds, J.W. (1979) Introduction to Analytical Electron Microscopy (Eds. J.J. Hren, J.I. Goldstein, and D.C. Joy), p. 387, Plenum Press, New York.Google Scholar
  3. Sung, C.M. and Williams, D.B. (1991) J. Electron Microsc. Tech. 17, 95. Williams, D.B. (1987) Practical Analytical Electron Microscopy in Materials Science, 2nd edition, p. 117, Philips Electron Optics Publishing Group, Mahwah, New Jersey.Google Scholar

Specific References

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  8. Reimer, L. (1993) Transmission Electron Microscopy; Physics of Image Formation and Microanalysis, 3rd edition, Springer-Verlag, New York.Google Scholar
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Copyright information

© Springer Science+Business Media New York 1996

Authors and Affiliations

  • David B. Williams
    • 1
  • C. Barry Carter
    • 2
  1. 1.Lehigh UniversityBethlehemUSA
  2. 2.University of MinnesotaMinneapolisUSA

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