Abstract
A very important concept in TEM is that we only diffract from small volumes. By definition, no specimens are infinite in all directions and all defects are small. Of course, the beam is also never infinitely wide! This chapter therefore discusses how the size of what we are examining influences the appearance of the DP. Although we will discuss many different aspects of diffraction, there are three important ideas which underlie all this discussion:
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We are diffracting from small volumes.
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We are diffracting from crystals.
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We need to index the DPs we see and relate the patterns to the image.
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References
General References
de Ridder, R., Van Landuyt, J., Gevers, R., and Amelinckx, S. (1968) Phys. stat. sol. 30, 797;
de Ridder, R., Van Landuyt, J., Gevers, R., and Amelinckx, S.(1970) ibid. 38, 747;
de Ridder, R., Van Landuyt, J., Gevers, R., and Amelinckx, S.(1970) ibid. 40, 271;
de Ridder, R., Van Landuyt, J., Gevers, R., and Amelinckx, S.(1970) ibid. 41, 519;
de Ridder, R., Van Landuyt, J., Gevers, R., and Amelinckx, S. (1970) ibid. 42, 645.
Gevers, R., Van Landuyt, J., and Amelinckx, S. (1966) Phys. stat. sol. 18, 343;
Gevers, R., Van Landuyt, J., and Amelinckx, S. (1967) ibid. 21, 393;
Gevers, R., Van Landuyt, J., and Amelinckx, S. (1967) ibid. 23, 549;
Gevers, R., Van Landuyt, J., and Amelinckx, S. (1968) ibid. 26, 577.
Van Landuyt, J. (1964) Phys. stat. sol. 6, 957.
Van Landuyt, J., Gevers, R., and Amelinckx, S. (1966) Phys. stat. sol. 13, 467;
Van Landuyt, J., Gevers, R., and Amelinckx, S. (1966) ibid. 18, 167.
Specific References
Carter, C.B. (1984) Phil. Mag. A50, 133.
Gevers, R. (1971) in Electron Microscopy in Materials Science (Ed. U. Valdrè), p. 302, Academic Press, New York.
Sauvage, M. and Parthé, E. (1972), Acta Cryst. A28, 607.
Wilson, J.A., Di Salvo, F.J., and Mahajan, S. (1975) Adv. Phys. 24, 117.
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Williams, D.B., Carter, C.B. (1996). Diffraction from Small Volumes. In: Transmission Electron Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-2519-3_17
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