Charge Tunneling Rates in Ultrasmall Junctions

  • Gert-Ludwig Ingold
  • Yu. V. Nazarov
Part of the NATO ASI Series book series (NSSB, volume 294)

Abstract

With the advances of microfabrication techniques in recent years it has become possible to fabricate tunnel junctions of increasingly smaller dimensions and thereby decreasing capacitance C. Nowadays one can study tunnel junctions in a regime where the charging energy E c = e2/2C is larger than the thermal energy k B T. Then charging effects play an important role and this has been the subject of a by now large body of both theoretical and experimental work.

Keywords

Cooper Pair Tunnel Junction Tunneling Process Single Junction Tunneling Rate 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media New York 1992

Authors and Affiliations

  • Gert-Ludwig Ingold
    • 1
  • Yu. V. Nazarov
    • 2
  1. 1.Fachbereich PhysikUniversität-GH EssenEssenGermany
  2. 2.Nuclear Physics InstituteMoscow State UniversityMoscowUSSR

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