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Optical Particle Sizing and Particle Characterization Based on Polarization Measurements

  • R. H. Zerull
  • R. T. Killinger
  • R. H. Giese

Abstract

Commercially available optical particle analyzers generally provide satisfactory results after adequate calibration with the particles in question. It is the purpose of this paper to point out, how the performance of optical particle sizers can be improved by polarization measurements.

Keywords

Polarization Measurement Scattered Radiation Scattered Intensity Cross Polarization Mueller Matrix 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

References

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Copyright information

© Springer Science+Business Media New York 1988

Authors and Affiliations

  • R. H. Zerull
    • 1
  • R. T. Killinger
    • 1
  • R. H. Giese
    • 1
  1. 1.Bereich Extraterrestrische PhysikRuhr-Universität BochumBochumGermany

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