Abstract
We now begin preparing for our systematic survey of SAFE space. Recurring features can help us plan our approach.
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© 1986 Springer Science+Business Media New York
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Troutman, R.R. (1986). Problem Description. In: Latchup in CMOS Technology. The Springer International Series in Engineering and Computer Science, vol 13. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-1887-4_3
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DOI: https://doi.org/10.1007/978-1-4757-1887-4_3
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4419-5199-1
Online ISBN: 978-1-4757-1887-4
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