Abstract
During the past 25 years, developments in the invention and production of solid state devices such as diodes, transistors, lasers, integrated circuits, etc., have been extremely rapid and there seems little reason to believe that there will be an appreciable slackening in the near future. Strong competition at the market level has pushed both researchers and producers into providing better and better devices tending towards what might be considered a theoretical “limit of optimum performance”. Consequently the problem of evaluation has become of major importance and there is growing difficulty in determining the long term reliability of the devices.
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D’Amico, A. (1979). Noise. In: Zemel, J.N. (eds) Nondestructive Evaluation of Semiconductor Materials and Devices. NATO Advanced Study Institutes Series, vol 46. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-1352-7_6
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