Extended X-Ray Absorption Fine Structure Studies at High Pressure
It is the purpose of this paper to review the problems and possibilities offered by EXAFS studies of materials at high pressures. This is a new field for which high pressure techniques must be refined. Cell designs and methods of measuring the pressure in situ which we have used are indicated. It will be seen that we are currently concerned with the accuracy in measuring bond lengths as a function of pressure and, learning what EXAFS can tell us about pressure-induced structural or electronic phase changes.
KeywordsBoron Carbide EXAFS Signal Stanford Synchrotron Radiation Laboratory Momentum Transfer Range Tungsten Carbide Anvil
Unable to display preview. Download preview PDF.
- 2.R. Ingalls, E. D. Crozier, J. E. Whitmore, A. J. Seary, and J. M. Tranquada, J. Appl. Phys., to be published.Google Scholar
- 4.S. Yamaoka, O. Shimomura, H. Nakazawa, and O. Kukunaga, Proc. 7th Int. Conf. High Pres. (AIRPT), Pergamon, to be published.Google Scholar
- 5.R. Ingalls, J. E. Whitmore, J. M. Tranquada, and E. D. Crozier, Proc. 7th Int. Conf. High Pres. (AIRPT), Pergamon, to be published.Google Scholar
- 7.V. Meisalo and M. Kalliomäki, High Temp. Pres. 5, 663 (1973).Google Scholar
- 8.B. Bunker, private communication.Google Scholar
- 10.A. Jayaraman, Proc. 6thInt. Conf. High Pres. (AIRPT), ed. K. D. Timmerhaus and M. S. Barber, Plenum, N.Y. (1979).Google Scholar
- 11.E. D. Crozier and A. J. Seary, Can. J. Phys. 58, 1388 (1980);E. D. Crozier, elsewhere in this book.Google Scholar
- 16a.P. A. Egelstaff and S. S. Wang, Can. J. Phys. 50, 2462 (1972).Google Scholar