Defect Visualisation: Individual Defects

  • A. R. Lang
Part of the Nato Advanced Study Institutes Series book series (NSSB, volume 63)

Abstract

This chapter will try to provide explanations and advice for the practising X-ray topographer. Much of the material has not previously been set down in print. The topics to be included have been selected with the needs of the inexperienced worker particularly in mind. Consequently, only the simpler techniques will be discussed: the section topograph, the projection topograph, and the scanning reflection topograph. However, X-ray topographers will surely want to read more comprehensive descriptions of the many techniques that have been devised over the years for various purposes, and to find out what results have been achieved using them. To do so, they may consult reviews by Armstrong [1] and Lang [2] (the latter preferably in the revised edition), and the monograph by Tanner [3]. Since X-ray topography is most widely known and practised as a non-destructive method for ‘seeing’ dislocations in crystals, a simply- worded review [4] spanning the topics of X-ray diffraction contrast from dislocations, other methods of observing dislocations, and the properties of dislocations themselves, may be found helpful.

Keywords

Diffract Beam Individual Defect Diffraction Contrast Convergence Angle Asymmetric Transmission 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    R.W. Armstrong and C.M. Wu (1973) in Microstructural Analysis Tools and Techniques (ed. J.L. McCall), Plenum Press, New York - London, p. 169Google Scholar
  2. 2.
    A.R. Lang (1978) in Diffraction and Imaging Techniques in Materials Science, Volume II: Imaging and Diffraction Techniques; Second, revised edition (ed. S. Amelinckx, R. Gevers, and J. Van Landuyt) North-Holland Publishing Co., Amsterdam - New York - Oxford, p. 623Google Scholar
  3. 3.
    B.K. Tanner (1976) X-ray Diffraction Topography, Pergamon Press, Oxford.Google Scholar
  4. 4.
    A.R. Lang (1973) in Crystal Growth: An Introduction (ed. P. Hartman) North-Holland Publishing Co., Amsterdam - New York - London,P. 444Google Scholar
  5. 5.
    B.W. Batterman and H. Cole (1964) Rev. Mod. Phys. 36, 681Google Scholar
  6. 6.
    A. Authier (1970) in Advances in Structure Research by Diffraction Methods, 10, (ed. R. Brill and R. Mason) Pergamon Press, Oxford, p. 1Google Scholar
  7. 7.
    M. Hart (1971) Reports on Prg. in Phys., 34, 435Google Scholar
  8. 8.
    N. Kato (1974) in X-ray Diffraction (ed. L. V. Azaroff) McGraw-Hill Book Co., New York - London, p. 176Google Scholar
  9. 9.
    A. Authier (1977) in X-ray Optics (ed. H-J.Queisser) Springer-Verlag, Berlin-Heidelberg - New York, p. 145CrossRefGoogle Scholar
  10. 10.
    Z-H. Mai, S. Mardix and A.R. Lang, (1980) J. Appl.Cryst.13, 180Google Scholar
  11. 11.
    A.R. Lang (1957) Acta Metall. 5, 358Google Scholar
  12. 12.
    A.R. Lang (1957) Acta Cryst. 10, 252Google Scholar
  13. 13.
    M. Hart and A.R. Lang (1961) Phys. Rev. Lett. 7, 120Google Scholar
  14. 14.
    A.R. Lang (1963) Brit. J. Appl. Phys. 14 904Google Scholar
  15. 15.
    A.R. Lang (1963) Rroc. R. Soc. Lond. A278 2 34Google Scholar
  16. 16.
    A.R. Lang (1957) Acta Cryst. 10, 839Google Scholar
  17. 17.
    F.C. Frank, B.R. Lawn, A.R. Lang and E.M. WilksGoogle Scholar
  18. (1976).
    Proc.Roy. Lond. Soc. A3O1, 239Google Scholar
  19. 18.
    I. Kiflawi and A.R. Lang (1976) Phil. Mag. 33, 697Google Scholar
  20. 19.
    A.R. Lang (1959) Acta Cryst. 2, 249Google Scholar
  21. 20.
    K. Haruta (1965) J. Appl. Phys. 36, 1789Google Scholar

Copyright information

© Springer Science+Business Media New York 1980

Authors and Affiliations

  • A. R. Lang

There are no affiliations available

Personalised recommendations