Abstract
This topic ‘spike topography’ for short, involves measuring scattered X-ray intensity as a function of position in two spaces: in real space as a function of location of the scattering volume element within the specimen crystal and in reciprocal space as a function of position of the scattering vector relative to a reciprocal lattice point (relp) of the perfect crystal. This chapter touches upon (1) background theory, (2) history of study of the anomalous ‘spike’ diffuse reflexions from diamond, (3) the findings of ‘spike’ topography and (4) likely future developments.
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Lang, A.R. (1980). Reciprocal Lattice Spike Topography. In: Tanner, B.K., Bowen, D.K. (eds) Characterization of Crystal Growth Defects by X-Ray Methods. Nato Advanced Study Institutes Series, vol 63. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-1126-4_24
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DOI: https://doi.org/10.1007/978-1-4757-1126-4_24
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