Monochromatic Synchrotron Radiation Topography

  • Michele Sauvage
Part of the Nato Advanced Study Institutes Series book series (NSSB, volume 63)


Synchrotron radiation has been used as an X-ray source for topography since 1974. A significant number of results have already been obtained by means of white beam topography as reported by Miltat [1]. However, since 1978, topographic experiments where a monochromatized beam was first extracted from the white spectrum prior to reflection in the sample have also been performed. When thinking of physical studies where the observation technique is topography, one has thus to decide which among the following imaging methods is the most appropriate: white beam topography, Lang or double-crystal topography using laboratory generators or monochromatized synchrotron radiation topography. The purpose of the present chapter is first to produce some guide lines which will help in promoting monochromatized synchrotron radiation topography and secondly to give typical examples of applications.


Synchrotron Radiation Alternative Magnetic Field Magnetic Domain Wall Scale Mark Dislocation Image 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


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  1. 1.
    J. Miltat, this volume, chapter 16Google Scholar
  2. 2.
    U. Bonse, this volume, chapter 11 Google Scholar
  3. 3.
    W. Hartmann and J. Miltat, submitted to Appl. Phys. Lett.Google Scholar
  4. 4.
    U. Bonse, (1958), Z. Phyz. 153, 278ADSCrossRefGoogle Scholar
  5. 5.
    H. Klapper, this volume, chapter 6Google Scholar
  6. 6.
    M. Hart, this volume, chapter 17Google Scholar
  7. 7.
    M. Sauvage (1978) Nucl. Instr. Meth. 152, 313Google Scholar
  8. 8.
    W. Parrish and C.G. Erickson (1978) Acta Cryst. A34, S4, 331Google Scholar
  9. 9.
    G. Brown and P. Eisenberger (1979) SSRL reports proposal no. 217Google Scholar
  10. 10.
    J.W.M. Du Mond (1937) Phys. Rev. 52, 871Google Scholar
  11. 11.
    J. Miltat and M. Kleman (1980) J. Appl. Phys., in pressGoogle Scholar
  12. 12.
    H. Hashizume, M. Sauvage, J. F. Petroff, B. Capelle, P. Riglet and T. Matsushita, submitted to Jap. J. Appl. Phys.Google Scholar
  13. 13.
    J.F. Petroff, M. Sauvage and P. Riglet (1980) Phil. Mag. (in press)Google Scholar
  14. 14.
    U. Bonse (1959) Z. Naturforsch 149, 1079ADSGoogle Scholar
  15. 15.
    T. Bedynska (1979) private communicationGoogle Scholar
  16. 16.
    P. Riglet, M. Sauvage, J.F. Petroff and Y. Epelboin (1980) Phil. Mag. (in press)Google Scholar
  17. 17.
    M. Ribet, J.C. Ribet, F. Lefaucheux and M.C. Robert, submitted to J. Cryst. GrowthGoogle Scholar
  18. 18.
    J. Yoshimura, T. Miyazaki, T. Wada, K. Kohra, M. Hosaka, T. Ogawa and S. Taki (1979) J. Cryst. Growth 46, 691.Google Scholar

Copyright information

© Springer Science+Business Media New York 1980

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  • Michele Sauvage

There are no affiliations available

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